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315 Commits (42bc1a43eeba2724f105ed98b76aa5276f83d1cc)

Author SHA1 Message Date
dbestm ef9949b9ea Merge remote-tracking branch 'refs/remotes/mbedmicro/master' into dev_disco_f469ni 2015-11-10 10:09:20 +01:00
adustm b390f4cc27 Merge branch 'master' of https://github.com/mbedmicro/mbed into DEV_DISCOF429ZI 2015-11-09 18:04:26 +01:00
adustm 31b410f3cb STM_DISCO_F429ZI: allow the test to pass on this DISCO_F429ZI with only 2 LEDs 2015-11-09 10:40:55 +01:00
dbestm 306f1290fe [DISCO_F469NI] enhance files to pass pin out tests 2015-11-05 17:30:17 +01:00
akhilpanayam 6f96d862aa * updated mbed tests for SAML21J18A. 2015-11-04 16:01:49 +05:30
Rafal Fabich 274d769a0e Added build target for STM32F410RB. 
Initial version that can be built is based on STM32F411RE target which is compatible with F410.
TODOs: MCU specific modifications in CMSIS/HAL like memory sizes/map, peripherals, clocks, etc.
 2015-10-27 13:50:52 +01:00
dbestm f769fee22f Merge branch 'master' of https://github.com/mbedmicro/mbed into dev_nucleo_f042k6 2015-10-01 14:04:34 +02:00
dbestm d3ae38ced6 [NUCLEO_F042K6] add nucleo_f042k6 support 2015-10-01 14:03:52 +02:00
akhilpanayam 6281ee8e71 * Added support for SAMD21G18A for Analog Test. 2015-09-29 10:33:04 +05:30
akhilpanayam ed74f3ae73 * Updated with corrections in PWM driver 
* Added PWM LED test for W25 (SAMD21G18A)
 2015-09-29 10:33:02 +05:30
akhilpanayam fef98f58e3 * updated interrupt chaining test. 2015-09-29 10:33:00 +05:30
vimalrajr 71ae8b0b9f Adding support for SAMD21G18A in SDK tests. 2015-09-29 10:32:59 +05:30
akhilpanayam 77bf03b30b * updated with test support for SAMD21G18A targets. Used pins commonly available in expansion headers of development boards. 
* USBTX and USBRX pins updated.
 2015-09-29 10:32:58 +05:30
adustm dd1e6f2843 Merge remote-tracking branch 'mbedmicro/master' into dev_NUCLEO_F031K6 2015-09-25 16:53:15 +02:00
Wojciech Gorniak a68263815f Merge branch 'master' of https://github.com/mbedmicro/mbed 2015-09-17 11:52:48 +02:00
adustm 95bf707325 NUCLEO_F031K6 : update python and test files 2015-09-11 15:11:35 +02:00
Pawel Rozanski f06226df4c ELMO's spi 2015-09-03 12:40:46 +02:00
akhilpanayam 4d5f7a3fa7 * updated port apis. 
* added supprot for SAMD21J18A for mbed SDK tests.
 2015-09-01 19:15:43 +05:30
akhilpanayam 37ddc4c0c3 * updated port apis for SAMD21J18A 
* correction in analogueout api
* test support for analogueout in mbed SDK
 2015-09-01 19:15:42 +05:30
vimalrajr b6e39b0735 Adding support for SAMD21J18A for mbed SDK tests. 2015-09-01 19:15:41 +05:30
Martin Kojtal 6f6625090c Merge pull request #1305 from bcostm/dev_NUCLEO_F446RE 
NUCLEO_F446RE - Improvements + update of all STM32F4 (PWM12 + map/system files)
 2015-08-20 10:40:11 +01:00
bcostm e4fd31fdfb Add this platform in MBED_A8 test 2015-08-17 15:09:46 +02:00
akhilpanayam 079b7cd697 * updated mbed SDK tests for SAMR21G18A 2015-08-14 17:36:29 +05:30
vimalrajr 52d4ac3ce1 Adding device specific support for SAMR21G18A in SDK tests. 2015-08-14 17:36:28 +05:30
Brian Daniels f2ea9c51c7 Added tests that ensure correct handling of setting Serial pins to NC 2015-06-10 11:04:05 -05:00
Martin Kojtal e775613c6b Merge pull request #1127 from bridadan/wfiTest 
Added tests for the WFI instruction
 2015-06-03 08:44:34 +01:00
Martin Kojtal 7a1d25e3df Merge pull request #1138 from stevew817/master 
Silicon Labs - Initial test framework pin definitions for EFM32 platforms
 2015-06-01 10:53:17 +01:00
Martin Kojtal 6f7f37eec7 Merge pull request #1118 from logost/LPC2460 
Introduction of new platform LPC2460 MCU
 2015-06-01 10:52:03 +01:00
Steven Cooreman d49d21cdca Pin definition update 2015-05-27 16:07:40 +02:00
Steven Cooreman 02d6b3200a Add pin definitions for Silicon Labs parts 2015-05-26 13:31:12 +02:00
ohagendorf 5b4e745674 [NUCLEO_F446RE] resolving rebase error and missing test 
- resolving a rebase conflict
- adding pin config for MBED_A7 test (interruptin)
 2015-05-23 19:10:54 +02:00
ohagendorf 455b417b8f [NUCLEO_F446RE] create new target - part 2 
Update system_stm32f4xx to new version, generated by STM32CubeMX
Add target name to digital_loop test
Update coide export template
 2015-05-23 19:03:12 +02:00
Brian Daniels 0551f6e8b9 Added tests for the WFI instruction 2015-05-21 15:17:17 -05:00
Dmitry Bogdanov 8ab2a95618 make some tests compilable 2015-05-18 13:31:10 +04:00
Martin Kojtal d50b62d49f Merge pull request #1078 from screamerbg/master 
Tests: mbed app shield test for the SPI display and improve the armcc regex support to support armsm output
 2015-05-04 08:30:55 +01:00
Martin Kojtal 334b3418df Merge pull request #1059 from devanlai/can-loopback-wip 
Implement some CAN modes for the LPC1549/LPC11Cxx/LPC1768
 2015-04-30 09:03:12 +01:00
Mihail Stoyanov c9324b7c0f Added C12832 LCD display library and SPI C12832 test. 2015-04-23 19:33:13 +03:00
Martin Kojtal ee76292c81 Merge pull request #1042 from bsilvereagle/master 
Replaced SPI pin definitions for K64F in SD tests
 2015-04-23 08:28:31 +01:00
Devan Lai 52f20bfcad [mbed][tests] Add CAN loopback test case 
Add test case that configures a MUT for in CAN self-test mode and sends a
series of test messages to verify that it works.
 2015-04-16 22:25:57 -07:00
bsilvereagle ec8ac75e88 Replaced SPI pin definitions for K64F in SD tests 
The old pin definitions were all for Port D pins, which are incorrect. These improper pin mappings caused all tests to fail.

Pin definitions were replaced with the definitions as stated here -
http://developer.mbed.org/media/uploads/sam_grove/xk64f_sensors.jpg.pagespeed.ic.RCpM8talCK.webp

Tests now pass on the K64F Sch Rev D1
 2015-04-15 09:11:39 -04:00
Jeremy Brodt 5ada69b73d [MAX32600MBED] Adding MAX32600MBED platform. 2015-04-14 10:00:23 -05:00
ohagendorf dce050a915 [TARGET_STMF4] reorg hal 
some test extensions
 2015-04-09 11:21:50 +02:00
ohagendorf 84c48c0f0b [TARGET_STMF4] reorg hal for ARCH_MAX 
same changes but for ARCH_MAX as in commit [TARGET_STMF4] reorg hal for
DISCO_F407VG

one bugfix for DISCO_F429 - wrong DAC channel numbers
 2015-04-09 11:21:46 +02:00
ohagendorf 34cfbedd6c [TARGET_STMF4] reorg hal for DISCO_F429ZI 
same changes but for DISCO_F429ZI as in commit [TARGET_STMF4] reorg
hal
for DISCO_F407VG
 2015-04-09 11:21:45 +02:00
ohagendorf 22de60432a [TARGET_STMF4] reorg hal for NUCLEO_F411RE 
same changes but for NUCLEO_F411RE as in commit [TARGET_STMF4] reorg hal
for DISCO_F407VG
 2015-04-09 11:21:45 +02:00
ohagendorf a70bdc5c00 [TARGET_STMF4] reorg hal for DISCO_F407VG 
Removing pin configuration from analogin_api, analogout_api and
pwmout_api (hal function, used by every STM32F4 target) to the target
specific files.
 2015-04-09 11:21:44 +02:00
Toyomasa Watarai 9fe3632b17 Add LPC11U68 support in Sleep test case 
- Add LPC11U68 target in MBED_4 test case
- Add wakeup pin for LPC11U68 target and set PullUp mode
 2015-04-09 16:06:53 +09:00
Martin Kojtal 071f4d0e44 Merge pull request #1003 from jeremybrodt/maxwsnenv 
Adding MAXWSNENV platform.
 2015-04-08 08:31:46 +02:00
Jeremy Brodt 3f7718cec4 Adding MAXWSNENV platform. 2015-04-07 13:39:09 -05:00
PaggyCyntec 0228696f48 Update main.cpp 
removed "union" because it causes the result of auto-test not stable (sometimes FAIL, sometimes PASS), after removed, the test result is  all PASS.
 2015-04-07 14:39:58 +08:00
Rob Meades 04d5c19e69 Vector table must be 256 aligned 
The vector table must be 256 aligned to work reliably, it must have been working by accident up to now.  This modification tested on a u-blox c027 board.  Without the change the value of `SCB->VTOR` and int_table are as follows:

`SCB->VTOR 0x10000280, int_table 0x100002a0`

...with the change they are as follows:

`SCB->VTOR 0x10000400, int_table 0x10000400`

...and the test passes.

See issue:

https://github.com/mbedmicro/mbed/issues/992
 2015-03-23 14:58:30 +00:00
bcostm 5af36d1e3b [NUCLEO_L073RZ] Add target in test files 2015-03-16 14:44:36 +01:00
Mihail Stoyanov 88281c839e Add AnalogIn potentiometer test for A0, A1 as present on the mbed application shield and automate MMA7660 test. 
Various flags for platforms and tests.
 2015-02-20 04:15:26 +02:00
Martin Kojtal c9e7f409af Merge pull request #900 from PrzemekWirkus/host_test_autodetection 
Host test autodetection improvements
 2015-02-16 09:37:56 +00:00
Przemek Wirkus 09c48e4081 Refactored names for MBED_HOSTTEST macros used in test case auto-detection 2015-02-11 10:37:03 +00:00
Przemek Wirkus 35c034c911 Added timeout detection from aut-detection MUT printout 
Timeout is captured by application supervising host_test and duration is modiffied

Added functionality preventing MUT printouts to reset device's timeout value or script execution timer counter
 2015-02-10 09:15:46 +00:00
Anders Lindvall dcc53f4bda Fixed target issues for TARGET_LPC4088_DM 
- Removed target alias from the EXPORT_MAP in targets.py as it didn't work
- Added copies of the LPC4088 target exporters
- Fixed flag issue in the gcc toolchain
- Changed defines in eth USBDevice, rpt and rtos to handle
  TARGET_LPC4088_DM
 2015-02-08 11:56:39 +01:00
Martin Kojtal 9f80c90477 Merge pull request #866 from Marcomissyou/master 
Add a new target DELTA_DFCM_NNN40
 2015-02-02 07:25:54 +00:00
Przemek Wirkus f40ec7a294 Added autodetection fior tests including MMA8451Q accelerometer 2015-01-30 13:51:41 +00:00
Przemek Wirkus ab472195ce Refactored EEPROM and InterruptIn test cases to do auto-detection act 
Refactoring Tested with few Nucleo boards and Nordic board
 2015-01-28 15:34:28 +00:00
Przemek Wirkus 812a1c3000 Refactored few peripheral tests like DigitalInOut, InteruptIn 
Checked refactoring progress on LPC11U24
 2015-01-28 10:08:03 +00:00
Przemek Wirkus b45d190b5d Refactored Semihost test (valid for few LPC platforms) 2015-01-28 09:11:54 +00:00
Przemek Wirkus c6134eb6a2 Refactored C++ test and added '+' sign as recognized character in auto-test description 2015-01-28 09:08:58 +00:00
Przemek Wirkus 4d435b94be Refactored DIV and VTAB relocation tests 
Ran checks for current implementation on LPC1768
 2015-01-28 08:54:40 +00:00
Przemek Wirkus a4bf0cf135 Refactored tests for SD card peripheral 2015-01-27 13:44:30 +00:00
Przemek Wirkus dcce4d7cde Refactored detection test to use new autodetection of host test 2015-01-27 13:24:11 +00:00
Przemek Wirkus d610f0b08a Refactored echo at 115200 test for new model of test autodetection 2015-01-27 13:17:36 +00:00
0xc0170 453e81fd4c Merge branch 'pinology' of https://github.com/PrzemekWirkus/mbed into PrzemekWirkus-pinology 
Conflicts:
	libraries/mbed/targets/cmsis/TARGET_STM/TARGET_STM32F4/TARGET_DISCO_F401VC/cmsis_nvic.c
 2015-01-27 14:15:48 +01:00
Przemek Wirkus a8506caa1d Refactored few more tests to support autodetection: basic, call_before_main, dev_null, rtc, stdio 2015-01-27 12:51:53 +00:00
Przemek Wirkus 6903b54b9e Refactored generic tests with timer host test supervision 
Reactored RTOS tests
 2015-01-27 12:10:16 +00:00
Marcomissyou e7c32aff0f modify main.cpp of analog and analog_in 2015-01-27 15:41:52 +08:00
Marcomissyou 7b4f177cdb remove older target 2015-01-27 14:56:59 +08:00
Marcomissyou 4a52c80ef5 solve conflict targets.py and i2c_api.c 
Merge remote-tracking branch 'upstream/master'

Conflicts:
	libraries/mbed/targets/hal/TARGET_NORDIC/TARGET_MCU_NRF51822/i2c_api.c
	workspace_tools/targets.py
 2015-01-27 14:16:17 +08:00
Przemek Wirkus 06848611d3 Added initial 'host test auto-detection API' 2015-01-26 12:29:48 +00:00
Przemek Wirkus 8c50826562 Removed extra checks for operator[] and replaced them with MBED_ASSERT for cleaner code 2015-01-26 08:47:44 +00:00
Martin Kojtal 2c2ab2cb06 Merge pull request #861 from NitinBhaskar/master 
On-Board SD Card support for LPC11U37H_401 board
 2015-01-26 06:46:38 +00:00
nitin.bhaskar.27.09@gmail.com 19fd60321b On-Board SD Card support added, SD Card related test cases updated too 2015-01-24 22:57:01 +05:30
ZKvAH 466223a617 fix read_result always false 
read_result always  false when read file success
 2015-01-24 13:38:20 +08:00
Marcomissyou 66a5f716e3 modify i2c_api, analog_api, system_brf51822.c, targets/py and add device.h, PinNames 2015-01-23 16:40:26 +08:00
Przemek Wirkus 0c3caf8d75 Refactored SD card basic test 
Included return value check from fopen() functions in read/write testcases
 2015-01-12 08:39:34 +00:00
bcostm e0e18f54d6 [NUCLEO_F070RB] Update tests with this target 2015-01-09 11:21:15 +01:00
Przemek Wirkus 3ec2247713 K22F: added peripheral pin definitions to SD card tests and I2C EEPROM tests 2015-01-08 14:06:39 +00:00
ohagendorf 0498e2619b [STMF4xx] reorg hal folder 
- some minor error correction
- add pin definition for 3 tests (MBED_A5,6,7)
- add new target disco_f401vc to travis_build

travis_build and all test are OK except missing STM32F4 target
MTS_MDOT_F405RG
 2015-01-04 14:14:52 +01:00
Przemek Wirkus 32cea97577 Added simple tests for BusOut component to check if we can use new features of BusOut::operator[] and DigitalOut::is_connected() 2014-12-19 15:36:55 +00:00
Toyomasa Watarai 600af8d001 [LPC11XX_11CXX] Fix SPI slave issue 
- Fix a bug reported here:
https://developer.mbed.org/questions/4872/SPISlave-Class-dosnt-work-on-LPC1114/
- Add IOCON settings to enable proper pin functions
- Remove non-busy check in slave_receive() function, since the SSP/SPI
is always in busy state when received a valid data according to the
device user manual
- Add bit mask in spi_slave_read() function
- Add TARGET_LPC1114 pin config in SPI_SLAVE test
- Tested with LPC11U24 SPI master and LPC1114 SPI slave
 2014-12-03 14:49:23 +09:00
Masao Hamanaka cf9fc3c4ac Add SD function 
Add SD function and tests for RZ_A1H.
 2014-11-27 17:12:57 +09:00
Masao Hamanaka a210914f42 Fixed some function's bugs 
Fixed some bugs and modified mmu setting.
Fixed functions as below
- analog in
- i2c
- interruptin
 2014-11-18 13:54:39 +09:00
Przemek Wirkus 62fcd83b23 Test MBED_A19: wrong I2C pins assigned to TARGET_LPC11U68 target because of leading TARGET_FF_ARDUINO 2014-10-28 13:22:25 +00:00
Toyomasa Watarai 03482e329d HAL : [LPC824] Fix SPI1 SWM table 
- Fix SPI ch1 switch matrix table value - detected by SPI_MASTER test
case
- Add LPC824 pinout for some test cases
- [LPC824] spi_api.c code refactoring
 2014-10-17 19:16:37 +09:00
Przemek Wirkus 42442233de Added new test MBED_34 to check two tickers with two detached alternately callbacks 2014-10-15 17:45:54 +01:00
Toyomasa Watarai d9479288a7 HAL : [LPC824] Fix I2C return value 
- Add LPC824 target for I2C test cases
- Fix I2C read/write return value bug, detected by I2C_MMA7660 test case
 2014-10-15 17:46:21 +09:00
Przemek Wirkus 0a0491cf0f Added new Unit Tests - General pool to cover common functionality and check if UT framework is working. This test pool can be extended with new tests 2014-09-24 16:22:19 +01:00
Przemek Wirkus 2ab8ad9b47 Feature: Device detection via serial - part 4 
Interrupt In test pinology for NUCLEO changed
 2014-09-24 14:58:14 +01:00
Przemek Wirkus da412da174 Feature: Device detection via serial - part 3 2014-09-24 14:58:10 +01:00
Przemek Wirkus 2e58f7922c Feature: Device detection via serial - part 1 2014-09-24 14:58:03 +01:00
Przemek Wirkus 3271e479b9 Minor modifications to mbed_main call testcase 2014-09-24 14:57:55 +01:00
bcostm c4bac8eb8a Tests: re-order and add new NUCLEO targets 2014-09-23 13:01:21 +02:00
Przemek Wirkus 1f3587f54a Added NUCLEO support for digital in/out tests 
Slightly modified digital in/out tests
 2014-09-23 10:53:53 +01:00
Przemek Wirkus 0a3e706703 Minor updates for InterruptIn testcase 2014-09-23 10:53:49 +01:00
Przemek Wirkus ea59d77d85 Small improvements to RTC test to check time elapsed and if timestamp is not zero 2014-09-22 10:06:39 +01:00