mirror of https://github.com/ARMmbed/mbed-os.git
Refactored EEPROM and InterruptIn test cases to do auto-detection act
Refactoring Tested with few Nucleo boards and Nordic boardpull/900/head
parent
b877fe32f9
commit
ab472195ce
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@ -70,8 +70,12 @@ const int i2c_freq_hz = 400000;
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const int i2c_delay_us = 0;
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}
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int main()
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{
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int main() {
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TEST_TIMEOUT(15);
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TEST_HOSTTEST(default_auto);
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TEST_DESCRIPTION(I2C EEPROM read write test);
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TEST_START("MBED_A19");
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const int EEPROM_MEM_ADDR = 0xA0;
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const char MARK = 0x66;
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int fw = 0;
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@ -143,5 +147,5 @@ int main()
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printf("\tTotal failures: %d\r\n", fw + fr + fc);
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}
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notify_completion(result);
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TEST_RESULT(result);
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}
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@ -22,13 +22,13 @@
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******************************************************************************/
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// Test configuration block
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namespace
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{
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namespace {
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const int ntests = 1000;
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const int i2c_freq_hz = 400000;
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const int i2c_delay_us = 0;
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// const int EEPROM_24LC256_SIZE = (256 * 1024 / 8); // 256 kbit memory
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}
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// End of test configuration block
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#if defined(TARGET_KL25Z)
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@ -75,8 +75,12 @@ I2C i2c(p28, p27);
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#define PATTERN_MASK 0x66, ~0x66, 0x00, 0xFF, 0xA5, 0x5A, 0xF0, 0x0F
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int main()
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{
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int main() {
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TEST_TIMEOUT(15);
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TEST_HOSTTEST(default_auto);
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TEST_DESCRIPTION(I2C EEPROM line read write test);
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TEST_START("MBED_A25");
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const int EEPROM_MEM_ADDR = 0xA0;
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bool result = true;
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@ -134,5 +138,5 @@ int main()
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printf("EEPROM: Pattern match errors: %d/%d ... [%s]\r\n", pattern_errors, ntests, pattern_errors ? "FAIL" : "OK");
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result = write_errors == 0 && read_errors == 0;
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notify_completion(result);
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TEST_RESULT(result);
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}
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@ -87,7 +87,7 @@ void flipper() {
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}
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int main() {
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TEST_TIMEOUT(20);
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TEST_TIMEOUT(15);
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TEST_HOSTTEST(default_auto);
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TEST_DESCRIPTION(InterruptIn);
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TEST_START("MBED_A7");
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@ -119,6 +119,7 @@ TESTS = [
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"id": "MBED_A7", "description": "InterruptIn",
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"source_dir": join(TEST_DIR, "mbed", "interruptin"),
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"dependencies": [MBED_LIBRARIES, TEST_MBED_LIB],
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"duration": 15,
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"automated": True,
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"peripherals": ["digital_loop"]
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},
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