Commit Graph

249 Commits (fbdf211df1b43ba1bcc56a5ed25c0852a8fcd374)

Author SHA1 Message Date
adustm 95bf707325 NUCLEO_F031K6 : update python and test files 2015-09-11 15:11:35 +02:00
akhilpanayam 4d5f7a3fa7 * updated port apis.
* added supprot for SAMD21J18A for mbed SDK tests.
2015-09-01 19:15:43 +05:30
akhilpanayam 37ddc4c0c3 * updated port apis for SAMD21J18A
* correction in analogueout api
* test support for analogueout in mbed SDK
2015-09-01 19:15:42 +05:30
vimalrajr b6e39b0735 Adding support for SAMD21J18A for mbed SDK tests. 2015-09-01 19:15:41 +05:30
Martin Kojtal 6f6625090c Merge pull request #1305 from bcostm/dev_NUCLEO_F446RE
NUCLEO_F446RE - Improvements + update of all STM32F4 (PWM12 + map/system files)
2015-08-20 10:40:11 +01:00
bcostm e4fd31fdfb Add this platform in MBED_A8 test 2015-08-17 15:09:46 +02:00
akhilpanayam 079b7cd697 * updated mbed SDK tests for SAMR21G18A 2015-08-14 17:36:29 +05:30
vimalrajr 52d4ac3ce1 Adding device specific support for SAMR21G18A in SDK tests. 2015-08-14 17:36:28 +05:30
Brian Daniels f2ea9c51c7 Added tests that ensure correct handling of setting Serial pins to NC 2015-06-10 11:04:05 -05:00
Martin Kojtal e775613c6b Merge pull request #1127 from bridadan/wfiTest
Added tests for the WFI instruction
2015-06-03 08:44:34 +01:00
Martin Kojtal 7a1d25e3df Merge pull request #1138 from stevew817/master
Silicon Labs - Initial test framework pin definitions for EFM32 platforms
2015-06-01 10:53:17 +01:00
Martin Kojtal 6f7f37eec7 Merge pull request #1118 from logost/LPC2460
Introduction of new platform LPC2460 MCU
2015-06-01 10:52:03 +01:00
Steven Cooreman d49d21cdca Pin definition update 2015-05-27 16:07:40 +02:00
Steven Cooreman 02d6b3200a Add pin definitions for Silicon Labs parts 2015-05-26 13:31:12 +02:00
ohagendorf 5b4e745674 [NUCLEO_F446RE] resolving rebase error and missing test
- resolving a rebase conflict
- adding pin config for MBED_A7 test (interruptin)
2015-05-23 19:10:54 +02:00
ohagendorf 455b417b8f [NUCLEO_F446RE] create new target - part 2
Update system_stm32f4xx to new version, generated by STM32CubeMX
Add target name to digital_loop test
Update coide export template
2015-05-23 19:03:12 +02:00
Brian Daniels 0551f6e8b9 Added tests for the WFI instruction 2015-05-21 15:17:17 -05:00
Dmitry Bogdanov 8ab2a95618 make some tests compilable 2015-05-18 13:31:10 +04:00
Martin Kojtal d50b62d49f Merge pull request #1078 from screamerbg/master
Tests: mbed app shield test for the SPI display and improve the armcc regex support to support armsm output
2015-05-04 08:30:55 +01:00
Martin Kojtal 334b3418df Merge pull request #1059 from devanlai/can-loopback-wip
Implement some CAN modes for the LPC1549/LPC11Cxx/LPC1768
2015-04-30 09:03:12 +01:00
Mihail Stoyanov c9324b7c0f Added C12832 LCD display library and SPI C12832 test. 2015-04-23 19:33:13 +03:00
Martin Kojtal ee76292c81 Merge pull request #1042 from bsilvereagle/master
Replaced SPI pin definitions for K64F in SD tests
2015-04-23 08:28:31 +01:00
Devan Lai 52f20bfcad [mbed][tests] Add CAN loopback test case
Add test case that configures a MUT for in CAN self-test mode and sends a
series of test messages to verify that it works.
2015-04-16 22:25:57 -07:00
bsilvereagle ec8ac75e88 Replaced SPI pin definitions for K64F in SD tests
The old pin definitions were all for Port D pins, which are incorrect. These improper pin mappings caused all tests to fail.

Pin definitions were replaced with the definitions as stated here -
http://developer.mbed.org/media/uploads/sam_grove/xk64f_sensors.jpg.pagespeed.ic.RCpM8talCK.webp

Tests now pass on the K64F Sch Rev D1
2015-04-15 09:11:39 -04:00
Jeremy Brodt 5ada69b73d [MAX32600MBED] Adding MAX32600MBED platform. 2015-04-14 10:00:23 -05:00
ohagendorf dce050a915 [TARGET_STMF4] reorg hal
some test extensions
2015-04-09 11:21:50 +02:00
ohagendorf 84c48c0f0b [TARGET_STMF4] reorg hal for ARCH_MAX
same changes but for ARCH_MAX as in commit [TARGET_STMF4] reorg hal for
DISCO_F407VG

one bugfix for DISCO_F429 - wrong DAC channel numbers
2015-04-09 11:21:46 +02:00
ohagendorf 34cfbedd6c [TARGET_STMF4] reorg hal for DISCO_F429ZI
same changes but for DISCO_F429ZI as in commit [TARGET_STMF4] reorg
hal
for DISCO_F407VG
2015-04-09 11:21:45 +02:00
ohagendorf 22de60432a [TARGET_STMF4] reorg hal for NUCLEO_F411RE
same changes but for NUCLEO_F411RE as in commit [TARGET_STMF4] reorg hal
for DISCO_F407VG
2015-04-09 11:21:45 +02:00
ohagendorf a70bdc5c00 [TARGET_STMF4] reorg hal for DISCO_F407VG
Removing pin configuration from analogin_api, analogout_api and
pwmout_api (hal function, used by every STM32F4 target) to the target
specific files.
2015-04-09 11:21:44 +02:00
Toyomasa Watarai 9fe3632b17 Add LPC11U68 support in Sleep test case
- Add LPC11U68 target in MBED_4 test case
- Add wakeup pin for LPC11U68 target and set PullUp mode
2015-04-09 16:06:53 +09:00
Martin Kojtal 071f4d0e44 Merge pull request #1003 from jeremybrodt/maxwsnenv
Adding MAXWSNENV platform.
2015-04-08 08:31:46 +02:00
Jeremy Brodt 3f7718cec4 Adding MAXWSNENV platform. 2015-04-07 13:39:09 -05:00
PaggyCyntec 0228696f48 Update main.cpp
removed "union" because it causes the result of auto-test not stable (sometimes FAIL, sometimes PASS), after removed, the test result is  all PASS.
2015-04-07 14:39:58 +08:00
Rob Meades 04d5c19e69 Vector table must be 256 aligned
The vector table must be 256 aligned to work reliably, it must have been working by accident up to now.  This modification tested on a u-blox c027 board.  Without the change the value of `SCB->VTOR` and int_table are as follows:

`SCB->VTOR 0x10000280, int_table 0x100002a0`

...with the change they are as follows:

`SCB->VTOR 0x10000400, int_table 0x10000400`

...and the test passes.

See issue:

https://github.com/mbedmicro/mbed/issues/992
2015-03-23 14:58:30 +00:00
bcostm 5af36d1e3b [NUCLEO_L073RZ] Add target in test files 2015-03-16 14:44:36 +01:00
Mihail Stoyanov 88281c839e Add AnalogIn potentiometer test for A0, A1 as present on the mbed application shield and automate MMA7660 test.
Various flags for platforms and tests.
2015-02-20 04:15:26 +02:00
Martin Kojtal c9e7f409af Merge pull request #900 from PrzemekWirkus/host_test_autodetection
Host test autodetection improvements
2015-02-16 09:37:56 +00:00
Przemek Wirkus 09c48e4081 Refactored names for MBED_HOSTTEST macros used in test case auto-detection 2015-02-11 10:37:03 +00:00
Przemek Wirkus 35c034c911 Added timeout detection from aut-detection MUT printout
Timeout is captured by application supervising host_test and duration is modiffied

Added functionality preventing MUT printouts to reset device's timeout value or script execution timer counter
2015-02-10 09:15:46 +00:00
Anders Lindvall dcc53f4bda Fixed target issues for TARGET_LPC4088_DM
- Removed target alias from the EXPORT_MAP in targets.py as it didn't work
- Added copies of the LPC4088 target exporters
- Fixed flag issue in the gcc toolchain
- Changed defines in eth USBDevice, rpt and rtos to handle
  TARGET_LPC4088_DM
2015-02-08 11:56:39 +01:00
Martin Kojtal 9f80c90477 Merge pull request #866 from Marcomissyou/master
Add a new target DELTA_DFCM_NNN40
2015-02-02 07:25:54 +00:00
Przemek Wirkus f40ec7a294 Added autodetection fior tests including MMA8451Q accelerometer 2015-01-30 13:51:41 +00:00
Przemek Wirkus ab472195ce Refactored EEPROM and InterruptIn test cases to do auto-detection act
Refactoring Tested with few Nucleo boards and Nordic board
2015-01-28 15:34:28 +00:00
Przemek Wirkus 812a1c3000 Refactored few peripheral tests like DigitalInOut, InteruptIn
Checked refactoring progress on LPC11U24
2015-01-28 10:08:03 +00:00
Przemek Wirkus b45d190b5d Refactored Semihost test (valid for few LPC platforms) 2015-01-28 09:11:54 +00:00
Przemek Wirkus c6134eb6a2 Refactored C++ test and added '+' sign as recognized character in auto-test description 2015-01-28 09:08:58 +00:00
Przemek Wirkus 4d435b94be Refactored DIV and VTAB relocation tests
Ran checks for current implementation on LPC1768
2015-01-28 08:54:40 +00:00
Przemek Wirkus a4bf0cf135 Refactored tests for SD card peripheral 2015-01-27 13:44:30 +00:00
Przemek Wirkus dcce4d7cde Refactored detection test to use new autodetection of host test 2015-01-27 13:24:11 +00:00