adustm
95bf707325
NUCLEO_F031K6 : update python and test files
2015-09-11 15:11:35 +02:00
akhilpanayam
4d5f7a3fa7
* updated port apis.
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* added supprot for SAMD21J18A for mbed SDK tests.
2015-09-01 19:15:43 +05:30
akhilpanayam
37ddc4c0c3
* updated port apis for SAMD21J18A
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* correction in analogueout api
* test support for analogueout in mbed SDK
2015-09-01 19:15:42 +05:30
vimalrajr
b6e39b0735
Adding support for SAMD21J18A for mbed SDK tests.
2015-09-01 19:15:41 +05:30
Martin Kojtal
6f6625090c
Merge pull request #1305 from bcostm/dev_NUCLEO_F446RE
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NUCLEO_F446RE - Improvements + update of all STM32F4 (PWM12 + map/system files)
2015-08-20 10:40:11 +01:00
bcostm
e4fd31fdfb
Add this platform in MBED_A8 test
2015-08-17 15:09:46 +02:00
akhilpanayam
079b7cd697
* updated mbed SDK tests for SAMR21G18A
2015-08-14 17:36:29 +05:30
vimalrajr
52d4ac3ce1
Adding device specific support for SAMR21G18A in SDK tests.
2015-08-14 17:36:28 +05:30
Brian Daniels
f2ea9c51c7
Added tests that ensure correct handling of setting Serial pins to NC
2015-06-10 11:04:05 -05:00
Martin Kojtal
e775613c6b
Merge pull request #1127 from bridadan/wfiTest
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Added tests for the WFI instruction
2015-06-03 08:44:34 +01:00
Martin Kojtal
7a1d25e3df
Merge pull request #1138 from stevew817/master
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Silicon Labs - Initial test framework pin definitions for EFM32 platforms
2015-06-01 10:53:17 +01:00
Martin Kojtal
6f7f37eec7
Merge pull request #1118 from logost/LPC2460
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Introduction of new platform LPC2460 MCU
2015-06-01 10:52:03 +01:00
Steven Cooreman
d49d21cdca
Pin definition update
2015-05-27 16:07:40 +02:00
Steven Cooreman
02d6b3200a
Add pin definitions for Silicon Labs parts
2015-05-26 13:31:12 +02:00
ohagendorf
5b4e745674
[NUCLEO_F446RE] resolving rebase error and missing test
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- resolving a rebase conflict
- adding pin config for MBED_A7 test (interruptin)
2015-05-23 19:10:54 +02:00
ohagendorf
455b417b8f
[NUCLEO_F446RE] create new target - part 2
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Update system_stm32f4xx to new version, generated by STM32CubeMX
Add target name to digital_loop test
Update coide export template
2015-05-23 19:03:12 +02:00
Brian Daniels
0551f6e8b9
Added tests for the WFI instruction
2015-05-21 15:17:17 -05:00
Dmitry Bogdanov
8ab2a95618
make some tests compilable
2015-05-18 13:31:10 +04:00
Martin Kojtal
d50b62d49f
Merge pull request #1078 from screamerbg/master
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Tests: mbed app shield test for the SPI display and improve the armcc regex support to support armsm output
2015-05-04 08:30:55 +01:00
Martin Kojtal
334b3418df
Merge pull request #1059 from devanlai/can-loopback-wip
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Implement some CAN modes for the LPC1549/LPC11Cxx/LPC1768
2015-04-30 09:03:12 +01:00
Mihail Stoyanov
c9324b7c0f
Added C12832 LCD display library and SPI C12832 test.
2015-04-23 19:33:13 +03:00
Martin Kojtal
ee76292c81
Merge pull request #1042 from bsilvereagle/master
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Replaced SPI pin definitions for K64F in SD tests
2015-04-23 08:28:31 +01:00
Devan Lai
52f20bfcad
[mbed][tests] Add CAN loopback test case
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Add test case that configures a MUT for in CAN self-test mode and sends a
series of test messages to verify that it works.
2015-04-16 22:25:57 -07:00
bsilvereagle
ec8ac75e88
Replaced SPI pin definitions for K64F in SD tests
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The old pin definitions were all for Port D pins, which are incorrect. These improper pin mappings caused all tests to fail.
Pin definitions were replaced with the definitions as stated here -
http://developer.mbed.org/media/uploads/sam_grove/xk64f_sensors.jpg.pagespeed.ic.RCpM8talCK.webp
Tests now pass on the K64F Sch Rev D1
2015-04-15 09:11:39 -04:00
Jeremy Brodt
5ada69b73d
[MAX32600MBED] Adding MAX32600MBED platform.
2015-04-14 10:00:23 -05:00
ohagendorf
dce050a915
[TARGET_STMF4] reorg hal
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some test extensions
2015-04-09 11:21:50 +02:00
ohagendorf
84c48c0f0b
[TARGET_STMF4] reorg hal for ARCH_MAX
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same changes but for ARCH_MAX as in commit [TARGET_STMF4] reorg hal for
DISCO_F407VG
one bugfix for DISCO_F429 - wrong DAC channel numbers
2015-04-09 11:21:46 +02:00
ohagendorf
34cfbedd6c
[TARGET_STMF4] reorg hal for DISCO_F429ZI
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same changes but for DISCO_F429ZI as in commit [TARGET_STMF4] reorg
hal
for DISCO_F407VG
2015-04-09 11:21:45 +02:00
ohagendorf
22de60432a
[TARGET_STMF4] reorg hal for NUCLEO_F411RE
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same changes but for NUCLEO_F411RE as in commit [TARGET_STMF4] reorg hal
for DISCO_F407VG
2015-04-09 11:21:45 +02:00
ohagendorf
a70bdc5c00
[TARGET_STMF4] reorg hal for DISCO_F407VG
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Removing pin configuration from analogin_api, analogout_api and
pwmout_api (hal function, used by every STM32F4 target) to the target
specific files.
2015-04-09 11:21:44 +02:00
Toyomasa Watarai
9fe3632b17
Add LPC11U68 support in Sleep test case
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- Add LPC11U68 target in MBED_4 test case
- Add wakeup pin for LPC11U68 target and set PullUp mode
2015-04-09 16:06:53 +09:00
Martin Kojtal
071f4d0e44
Merge pull request #1003 from jeremybrodt/maxwsnenv
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Adding MAXWSNENV platform.
2015-04-08 08:31:46 +02:00
Jeremy Brodt
3f7718cec4
Adding MAXWSNENV platform.
2015-04-07 13:39:09 -05:00
PaggyCyntec
0228696f48
Update main.cpp
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removed "union" because it causes the result of auto-test not stable (sometimes FAIL, sometimes PASS), after removed, the test result is all PASS.
2015-04-07 14:39:58 +08:00
Rob Meades
04d5c19e69
Vector table must be 256 aligned
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The vector table must be 256 aligned to work reliably, it must have been working by accident up to now. This modification tested on a u-blox c027 board. Without the change the value of `SCB->VTOR` and int_table are as follows:
`SCB->VTOR 0x10000280, int_table 0x100002a0`
...with the change they are as follows:
`SCB->VTOR 0x10000400, int_table 0x10000400`
...and the test passes.
See issue:
https://github.com/mbedmicro/mbed/issues/992
2015-03-23 14:58:30 +00:00
bcostm
5af36d1e3b
[NUCLEO_L073RZ] Add target in test files
2015-03-16 14:44:36 +01:00
Mihail Stoyanov
88281c839e
Add AnalogIn potentiometer test for A0, A1 as present on the mbed application shield and automate MMA7660 test.
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Various flags for platforms and tests.
2015-02-20 04:15:26 +02:00
Martin Kojtal
c9e7f409af
Merge pull request #900 from PrzemekWirkus/host_test_autodetection
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Host test autodetection improvements
2015-02-16 09:37:56 +00:00
Przemek Wirkus
09c48e4081
Refactored names for MBED_HOSTTEST macros used in test case auto-detection
2015-02-11 10:37:03 +00:00
Przemek Wirkus
35c034c911
Added timeout detection from aut-detection MUT printout
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Timeout is captured by application supervising host_test and duration is modiffied
Added functionality preventing MUT printouts to reset device's timeout value or script execution timer counter
2015-02-10 09:15:46 +00:00
Anders Lindvall
dcc53f4bda
Fixed target issues for TARGET_LPC4088_DM
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- Removed target alias from the EXPORT_MAP in targets.py as it didn't work
- Added copies of the LPC4088 target exporters
- Fixed flag issue in the gcc toolchain
- Changed defines in eth USBDevice, rpt and rtos to handle
TARGET_LPC4088_DM
2015-02-08 11:56:39 +01:00
Martin Kojtal
9f80c90477
Merge pull request #866 from Marcomissyou/master
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Add a new target DELTA_DFCM_NNN40
2015-02-02 07:25:54 +00:00
Przemek Wirkus
f40ec7a294
Added autodetection fior tests including MMA8451Q accelerometer
2015-01-30 13:51:41 +00:00
Przemek Wirkus
ab472195ce
Refactored EEPROM and InterruptIn test cases to do auto-detection act
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Refactoring Tested with few Nucleo boards and Nordic board
2015-01-28 15:34:28 +00:00
Przemek Wirkus
812a1c3000
Refactored few peripheral tests like DigitalInOut, InteruptIn
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Checked refactoring progress on LPC11U24
2015-01-28 10:08:03 +00:00
Przemek Wirkus
b45d190b5d
Refactored Semihost test (valid for few LPC platforms)
2015-01-28 09:11:54 +00:00
Przemek Wirkus
c6134eb6a2
Refactored C++ test and added '+' sign as recognized character in auto-test description
2015-01-28 09:08:58 +00:00
Przemek Wirkus
4d435b94be
Refactored DIV and VTAB relocation tests
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Ran checks for current implementation on LPC1768
2015-01-28 08:54:40 +00:00
Przemek Wirkus
a4bf0cf135
Refactored tests for SD card peripheral
2015-01-27 13:44:30 +00:00
Przemek Wirkus
dcce4d7cde
Refactored detection test to use new autodetection of host test
2015-01-27 13:24:11 +00:00