The latest rebase of the watchdog feature branch introduced errors in compiling
watchdog tests due to missing headers.
- Watchdog HAL API test
Include missing header files to main.cpp (mbed_wait_api.h, stdlib.h).
- Watchdog HAL API timing test
Include missing header files to main.cpp (us_ticker_api.h).
- Watchdog Driver API test
Include missing header files to main.cpp (mbed_wait_api.h, stdlib.h).
Inject mbed namespace into main.cpp to fix Watchdog name resolution.
On NUMAKER_PFM_NANO130 target, WDT's clock source is fixed to LIRC, which is much
less accurate than other targets. Enlarge delta define to pass this test.
due to partial implementation. Having FUTURE_SEQUANA_M0 and
FUTURE_SEQUANA PSA targets is misleading.
Signed-off-by: Devaraj Ranganna <devaraj.ranganna@arm.com>
On platforms using coretx m33 accessing the secure memory will cause SecureFault instead of Hardfault.
SecureFault is implemented in the secure image and cannot be changed in runtime.
Add calls to `mbedtls_platform_setup()` and
`mbedtls_platform_terminate()` to the trng greentea test, to
initialize the hardware acceleration engines, in some platforms.
Test checks stack sizes:
- ISR stack: exactly 1KB (with exception for NORDIC - 2KB and RENESAS - Cortex A targets not supported for this test)
- Main thread stack: exactly 4KB (with some exceptions - 3KB)
- Thread stack: exactly 4KB
Frequency setting just after erase operation was causing some data
inconsistencies during write/read operations on some targets (frdm-k82f).
To fix this, frequency setting was moved before flash memory init.
The DEVICE_FOO macros are always defined (either 0 or 1).
This patch replaces any instances of a define check on a DEVICE_FOO
macro with value test instead.
Signed-off-by: Alastair D'Silva <alastair@d-silva.org>
For enhanced security ARMv8-M firmware doesn't allow the hardfault
handler to be hooked by non-secure code. Because of this there is no
way to recover from the MPU fault tests. This PR disables those tests
until hardfault recovery is supported by secure firmware.
Ensure that code written to ram is flushed and that caches are cleared
before attempting to executing from ram. This fixes CI failures on the
MPU test when it is built for Cotex-M7 devices such as the
NUCLEO-F746ZG.
Make the following changes:
-Allow a vector specific ARM MPU driver by defining MBED_MPU_CUSTOM
-Allow ROM address to be configured for ARMv7-M devices by
setting the define MBED_MPU_ROM_END
-Add ROM write protection
-Add new functions and lock
-enable at boot
-disable during flash programming
Create a dedicated MPU directory for standard Arm MPU implementations
in preparation for the Arm v8m MPU. Replace MBED_MPU_ENABLED with
DEVICE_MPU to align with the porting layer of other HAL APIs.
When programming flash using the FlashIAP API allow execution from
ram. Many devices require flashing to be done from RAM.
Also allow execution from ram when running the low level flash tests.
Test that the MPU correctly stops execution of memory in the stack
region, heap region, data region and bss region. Also check that the
MPU can be enabled, disabled and freed.
When DEVICE_LPTICKER is defined set_time() only works correctly on
the first call. This test calls set_time() twice and ensures the
time set by both calls is correct. This test only runs if
DEVICE_RTC or DEVICE_LPTICKER is defined.
1. Add flash config files.
2. Flash used is MX25U3235F, include information for this
device in the flash config file
Signed-off-by: Mahesh Mahadevan <mahesh.mahadevan@nxp.com>
Static Thread methods and signal methods have been deprecated. Remove
all references in the main code, and most of the tests. Some tests of
the deprecated APIs themselves remain.
This is fix for issue 8368.
Test is causing some problems on `REALTEK_RTL8195AM` and `ARM` compiler. There is some kind of memory issue. Probably there is not enough memory space for global data provided by the test. Data definitions have been moved into test function body so, they will land on stack. With this fix the test works on `REALTEK_RTL8195AM/ARM`.
Increase delta to 500 us. This value is still short enough to detect
incorrect behavior of the sleep_manager_can_deep_sleep_test_check() fun,
but allows the targets with low LP timer accuracy to pass, i.e.
NUCLEO_F429ZI.
There is no problem with this test during the morph, but some issue has been noticed while testing new Jenkins CI in Oulu on NRF52_DK.
I was able to reproduce the issue locally. The difference between morph and local run is that CPU statistics are enabled on morph. This makes the difference and test passes.
The sleep test case perform sleep for 100 us, 200 us, ... ,1000 us in loop (us ticker wakes the board) and verifies if sleep time matches the assumption.
I got the following results:
sleep wake-up after
100 us ~100 us ok
200 us ~200 us ok
300 us ~300 us ok
400 us ~400 us ok
500 us ~14 us (??)
When requested sleep time is equal to 500 us some unexpected interrupt occurs which wakeup the board and force the test to fail.
Register state just after exit from sleep:
Control and State Register: 0x00400000 (ISRPENDING - Interrupt pending flag is set).
NVIC Interrupt Set-pending Register[0]: 0x00000004 (UARTE0_UART0_IRQn) or 0x00000200 (TIMER1_IRQn - timer used by us ticker).
UART interrupt is generated because of green-tea transmission. We know that it is performed while test is executed since we need to wait before going into deep-sleep since otherwise the transmission will be broken. So to take care of UART interrupt we need to wait before sleep test in the same way like it is done in deep-sleep test.
Add a test to ensure that devices have at least 2K free ram
and 2K free heap. This test should be the first test that fails
due to running out of ram or heap.
- code refactoring and preparation for enabling DPI/QPI tests
- reduced multiple test count to 4
- use common flash config header for all MX25RXX35F chips
- fix sector erase max time on N25Q128A
Main idea of introduced changes is to ease adding support for new flash chips
Major changes:
- move implementation of all memory chip specific functions to memory config file (no weak functions)
- add support for 1-2-2 write
To handle timer rollovers the test tests-mbed_hal-common_tickers_freq
calls intf->set_interrupt(0). For this to work correctly the ticker
implementation must fire an interrupt on every rollover event though
intf->set_interrupt(0) was called only once. Whether an interrupt will
fire only once or multiple times is undefined behavior which
cannot be relied upon.
To avoid this undefined behavior this patch continually schedules an
interrupt and performs overflow detection on every read. This also
removes the possibility of race conditions due to overflowCounter
incrementing at the wrong time.
FastModels targets are simulator running on the x86 hosts.
As the nature of non-RealTime x86 OS and FastModels, timing accuracy is not guaranteed
So skipping the time drifting tests on FastModel targets
When the define LPTICKER_DELAY_TICKS is set deep sleep can be randomly
disallowed when using the low power ticker. This is because a Timer
object, which locks deep sleep, is used to protect from back-to-back
writes to lp tickers which can't support that. This causes tests which
assert that deep sleep is allowed to intermittently fail.
To fix this intermittent failure this patch adds the function
sleep_manager_can_deep_sleep_test_check() which checks if deep sleep
is allowed over a duration. It updates all the tests to use
sleep_manager_can_deep_sleep_test_check() rather
than sleep_manager_can_deep_sleep() so the tests work even if deep
sleep is spuriously blocked.
This is solution to issue #7724.
Ticker free tests have been removed since ticker free function has been implemented only for CI boards.
Implementation for the remaining platforms will be done on feature branch feature-hal-ticker-free.
In `ticker speed` test case execution time of ticker API functions is measured using Timer object. Test replaces original ticker handler for testing purposes, so test should not relay on higher level ticker based features(like Timer).
Use low level ticker API for time measuring.
In mbed-os-tests-mbed_hal-common_tickers/Microsecond ticker overflow test, some targets
would fail to catch specified ticker value near overflow in time and so fail. This commit
alleviates the issue by checking ticker value range rather than one exact ticker value near
overflow.
Serial buffer must be flushed before entering deep sleep mode. In the test this is done by the additional delay which is implemented on the busy loop which decrements given value down to 0 (`void wait_cycles(volatile unsigned int cycles)`). This solution is not appropriate since it is very target specific and the cycles value has been already increased few times. Additionally very big number of loop cycles which is suitable for fast targets may take much longer on slower boards and results in test timeout.
It has been verified that 20ms is sufficient delay for the green-tea transmission. In this test we cannot simply use `wait_ms(20)` since this potentially may put board to sleep and wake up using lp ticker. The test re-initialzies the lp ticker(disables ticker interrupt) and this operation may break the schedule and time tracing by the upper layer. But we can use us ticker which is not affected by this test. The solution is to add a delay routine based on busy loop and us ticker only. This way are able to wait exactly 20 ms.
As we do not include rtx_lib header file anymore, these symbols are not available.
Use core util for if ISR is active. And for OS tick, pull in os_tick header file.
Mark mbed-os-tests-mbed_hal-common_tickers/time_cpu_cycles not in-lined.
Otherwise, time_cpu_cycles may be in-lined somewhere and takes different
CPU cycles on invocation.
Increases tolerance value for sleep_usticker_test to cover extra time needed
for cpu stats computation (for more details see MBED_CPU_STATS_ENABLED).
Prevent scheduling interrupt during ticker initialization (in lp_ticker_init)
while test execution.
In case when base tick count is different than next tick count check first if the difference is equal to 1 tick (this is what we are looking for) if not then decrease the tick count.
Repeat counting process few times before incrementing the number of cycles in case when base tick count is equal to next tick count.