With default sampling time, the MBED2 and CI test shield tests would fail
because the stabilization slope of ADC is relatively slow.
ERROR (out:0.8000) - (in:0.7407) = (0.0593)
ERROR (out:0.9000) - (in:0.8354) = (0.0646)
ERROR (out:1.0000) - (in:0.9289) = (0.0711)
This is related to the 10kOhms resistors used to connect Ain to
Aout mounted on the CI shileds, and internal capacitance of L0 targets.
If connecting Ain and Aout with wires, bypassing the resistors, the test
is passed. So we're increasing the sampling time to let the automated
ci shiled tests PASS.
OK (out:0.8000) - (in:0.7863) = (0.0137)
OK (out:0.9000) - (in:0.8869) = (0.0131)
OK (out:1.0000) - (in:0.9844) = (0.0156)
Moving some code in common to be able to manage several ADC instances,
or several channels of an instance.
The change involves:
- moving dac_s structure definition to common_object.h
- create TARGET_STM/analogout_api.c and move fully common analog_out
functions in there
- rename analogout_api.c of each target family into analogout_device.c
to keep platform specific code
- update analogout_device.c to rely on obj->handle and obj->channel
- align analogout_init function as much as possible between families in
analogout_device.c files
ADC1 channel2 and ADC2 of few targets only have an output switch and no
buffer. This switch needs to be enabled, and also the buffer can be enabled
in order to reduce the output impedance on output, and to drive external
loads directly without having to add an external operational amplifier.
This allows a proper handling of multiple instances. Also this commit
stores the channel in the HAL format so that it can be re-used more easily
and call to HAL are straightforward.
1. Private _acquire() function is added to avoid multiple locking/unlocking
2. format and frequency functions updated to use appropriate function calls
instead of a aquire()
"FAMILY_STM32" has been creeated with all common features.
All STM32 devices can now inherit from it.
This will simplify readability and maintainability.
+ VBLUno51 board:
Nordic nRF51822
Bluetooth Low Energy
DAPLink interface
Arduino UNO pinout compatible
4 Power
+ Wiki: https://vngiotlab.github.io/vbluno/
+ Pass all test case in mbed test suite
Signed-off-by: iotvietmember <robotden@gmail.com>
1) mbed-os-tests-mbedmicro-rtos-mbed-basic tests use to fail when run in loop
after 20-25, This was because the stack used by test application was in range of
744-840 bytes. So bumped the stack size to 1024 bytes.
2) Corrected the assert and taken out the assert which was not required.
In the new approach the host controls the device activity when the test
should start, finish and pass/fail status is send to device. Also deprecate
the test cases which can't accurately test.
Laurent MEUNIER
Armelle DUBOC
Yuguo Zou
Jimmy Brisson
Deepika
bcostm
jeromecoutant
iotvietmember
Anna Bridge
adustm
Shrikant Tudavekar
Martin Kojtal
amq
Rob Meades
arostm