mbed-os/TESTS/mbed_hal_fpga_ci_test_shield
Chun-Chieh Li 1bf6d898b0 FPGA: Free up I2C pins to avoid interference with following I2C tests
The most suitable place to free up I2C pins is in i2c_free(). Due to
i2c_free() not available in I2C HAL, we free up I2C pins manually by
configuring them back to GPIO.

Without free-up of I2C pins, SDA/SCL pins of the same I2C peripheral may
share by multiple ports due to 'all ports' tests here, and the following I2C
tests would be subject to interference by shared ports.
2019-08-20 13:12:40 +08:00
..
analogin Increase ADC test tolerance to 5% 2019-07-10 14:12:46 +01:00
gpio FPGA: Skip some Nuvoton targets not supporting input pull-up/pull-down mode 2019-08-20 13:12:02 +08:00
gpio_irq Test: FPGA shield: Update the GPIO-IRQ API tests 2019-07-25 11:04:10 +02:00
i2c FPGA: Free up I2C pins to avoid interference with following I2C tests 2019-08-20 13:12:40 +08:00
pwm FPGA PWM: wait 1 period before measurement 2019-07-09 22:41:27 +02:00
spi Merge pull request #11009 from jeromecoutant/PR_SPI4 2019-08-05 17:08:42 +03:00
uart Fix CI for branch feature-public-headers (#11093) 2019-08-02 12:32:40 +01:00