Commit Graph

6 Commits (f6a70b20281ac790e4644a5afa41eca2e2de6a10)

Author SHA1 Message Date
Steven Cooreman f6a70b2028 Increase ADC test tolerance to 5%
During the SiP workshop, we discovered that 3% is too narrow due to a combination of:
Voltage rail differences between target and FPGA
Extension of lesser-resolution ADC's to 16-bit results
2019-07-10 14:12:46 +01:00
Russ Butler e74e3dd124 FPGA test shield: Allow any defined form factor
Build in the FPGA tests if either MBED_CONF_TARGET_DEFAULT_FORM_FACTOR
or TARGET_FF_ARDUINO is defined.
2019-07-08 09:42:30 +02:00
Filip Jagodzinski d425dc9ba4 FPGA test shield: Restrict tests to Arduino FF only
Currently only the Arduino form factor is supported. Support for other
form factors will be added in the future.
2019-07-05 14:51:18 +02:00
Przemyslaw Stekiel 879d8917c4 FPGA Analogin test: Remove test case which can not be executed
The test case which checks full range cannot be executed at the moment due to a hardware bug in FPGA-Test-Shield.
This test case will be restored when the final version of FPGA-Test-Shield is ready.
2019-07-04 13:52:19 +02:00
Przemyslaw Stekiel 852456006b FPGA Analogin test: Remove usage of FULL_TEST_SHIELD symbol, increase tolerance
Keep "AnalogIn - full test" disabled due to hardware issue in the first rev of FPGA Test Shield.
2019-07-03 12:27:25 +02:00
Przemyslaw Stekiel cd0ad518cc Bring FPGA-Test-Shield tests into Mbed-os master. 2019-06-13 13:43:25 +02:00