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21 Commits (e3bde44b876bbb0051923a3fdf668cd06b51b5ad)

Author SHA1 Message Date
Mahadevan Mahesh f512738f91 Add support for KL27Z FRDM board 
Signed-off-by: Mahadevan Mahesh <Mahesh.Mahadevan@nxp.com>
 2016-04-29 15:45:05 -05:00
mbedNoobNinja fa0bf58e3c New mbed platform VK_RZ_A1H 2016-04-26 17:27:39 +03:00
Rafal Fabich 63574f4c48 Added build target for STM32F410RB. 
Initial version that can be built is based on STM32F411RE target which is compatible with F410.
TODOs: MCU specific modifications in CMSIS/HAL like memory sizes/map, peripherals, clocks, etc.
 2015-11-12 09:07:47 +01:00
bcostm 5af36d1e3b [NUCLEO_L073RZ] Add target in test files 2015-03-16 14:44:36 +01:00
Mihail Stoyanov 88281c839e Add AnalogIn potentiometer test for A0, A1 as present on the mbed application shield and automate MMA7660 test. 
Various flags for platforms and tests.
 2015-02-20 04:15:26 +02:00
Martin Kojtal c9e7f409af Merge pull request #900 from PrzemekWirkus/host_test_autodetection 
Host test autodetection improvements
 2015-02-16 09:37:56 +00:00
Przemek Wirkus 09c48e4081 Refactored names for MBED_HOSTTEST macros used in test case auto-detection 2015-02-11 10:37:03 +00:00
Przemek Wirkus ab472195ce Refactored EEPROM and InterruptIn test cases to do auto-detection act 
Refactoring Tested with few Nucleo boards and Nordic board
 2015-01-28 15:34:28 +00:00
Marcomissyou 7b4f177cdb remove older target 2015-01-27 14:56:59 +08:00
bcostm e0e18f54d6 [NUCLEO_F070RB] Update tests with this target 2015-01-09 11:21:15 +01:00
Przemek Wirkus 3ec2247713 K22F: added peripheral pin definitions to SD card tests and I2C EEPROM tests 2015-01-08 14:06:39 +00:00
bcostm c4bac8eb8a Tests: re-order and add new NUCLEO targets 2014-09-23 13:01:21 +02:00
Przemek Wirkus 12c7ba5ee2 Small refactoring for SD card tests for TARGET_K64F platform 2014-07-28 13:35:10 +01:00
Przemek Wirkus da68637753 Removed compilation warning about unused variable in i2c test 2014-07-15 12:08:35 +01:00
Przemek Wirkus ac667d6a3e Added SD card and EEPROM test pins for new Freescale K20D50M platform 2014-07-15 10:13:20 +01:00
Przemek Wirkus a7d1228723 Added new NUCLEO boards definitions to general tests 2014-06-23 15:56:47 +01:00
Przemek Wirkus 7afde21d4d Added pins for EEPROM line test 2014-05-20 15:24:21 +01:00
Przemek Wirkus 63d2bba43c Add new ST target TARGET_NUCLEO_L053R8 to few tests 2014-05-14 14:54:11 +01:00
Przemek Wirkus 044b5131cb Added NUCLEO_F103RB, NUCLEO_L152RE, NUCLEO_F302R8, NUCLEO_F030R8, NUCLEO_F401RE defines to timer tests. Fixed bug related to Nucleo not responding to singletest.py test execution 2014-05-02 19:54:40 +01:00
Przemek Wirkus 4927a9d7e3 Small updates for test MBED_A12, MBED_A19, MBED_A25 (SD, EEPROM, EEPROM) 2014-04-24 13:48:39 +01:00
Przemek Wirkus 77c96631cc Updated MBED_A19 24LC256 EEPROM test. Added new test MBED_A25 24LC256 I2C EEPROM pattern write/read to test suite 2014-04-24 13:48:38 +01:00