The TEST_SKIP and TEST_SKIP_UNLESS macros (w/ and w/o messages) allow the test
to skip the test case execution from the point the macro was called (without
failing the test).
Serial buffer must be flushed before entering deep sleep mode. In the test this is done by the additional delay which is implemented on the busy loop which decrements given value down to 0 (`void wait_cycles(volatile unsigned int cycles)`). This solution is not appropriate since it is very target specific and the cycles value has been already increased few times. Additionally very big number of loop cycles which is suitable for fast targets may take much longer on slower boards and results in test timeout.
It has been verified that 20ms is sufficient delay for the green-tea transmission. In this test we cannot simply use `wait_ms(20)` since this potentially may put board to sleep and wake up using lp ticker. The test re-initialzies the lp ticker(disables ticker interrupt) and this operation may break the schedule and time tracing by the upper layer. But we can use us ticker which is not affected by this test. The solution is to add a delay routine based on busy loop and us ticker only. This way are able to wait exactly 20 ms.
For ABP: First call to connect() or connect(params) will return LORAWAN_STATUS_OK
and a CONNECTED event will be sent. Any subsequent call will return
LORAWAN_STATUS_ALREADY_CONNECTED (posix EISCONN) and no event is generated.
FOR OTAA: First call to connect() or connect(params) will return LORAWAN_STATUS_CONNECT_IN_PROGRESS
and a CONNECTED event will be sent whenever the JoinAccept is received. If the application
calls connect again before receiving the CONNECTED event, LORAWAN_STATUS_BUSY will be returned.
After the CONNECTED event is dispatched, any subsequent call to connect() or connect(params) API
will be returned with LORWAN_STATUS_ALREADY_CONNECTED.
No new parameters are accepted after the first call. The application must disconnect before making
a connect() call with new parameters.
This is a remedy for the issue #7230.
While the device is joining, LORAWAN_STATUS_CONNECT_IN_PROGRESS is returned.
However, if the device is already joined, we will return LORAWAN_STATUS_ALREADY_CONNECTED.
The test sometimes fails on NRF51_DK (test case: "Test: LowPowerTimer - time measurement 1 ms.") in morph tests.
The test verifies if LowPowerTimer class correctly counts elapsed time. Sometimes we got measured ~1600 us for delay 1000 us (delta 550 us).
The delay is performed using `wait_us()` function which for delays greater than or equal to 1 ms (our case) calls `Thread::wait((uint32_t)ms);`. This causes rescheduling and potentially can put board into sleep (deep sleep mode is disabled by `wait_us()`). For our test purposes we don't need rescheduling/sleep since this actions takes extra time and have influence on the time measurement accuracy.
The solution is to implement function for delay which is based on busy loop and uses us ticker. It has been verified that this solves the problem. With this fix when measurement of 1 ms is repeated 1000 times we got usually measured time equal to ~1080 us, and sometimes ~1300us (checked that this is caused by systick interrupt handling). Since this is test for drivers layer and the results are acceptable I decided to not disabling systick in the test).
- RTC_SSR for the subseconds
- RTC_TR for the time
- RTC_DR for the date
These registers were accessed through shadow registers which are synchronized with PCLK1 (APB1 clock).
They are now accessed directly in order to avoid waiting for the synchronization duration.
- Move back the 16/32bit timer initialization in HAL_InitTick() and not in us_ticker_init()
- Use ticker_read_us() and us_ticker_read() in HAL_GetTick() to fix potential overflow issue with the 16bit timer
==> These corrections allow timer, rtc, sleep, tick tests to PASS
Deepika
cyliangtw
Jimmy Brisson
David Saada
Steven Cooreman
Martin Kojtal
Cruz Monrreal II
bcostm
jeromecoutant
Przemyslaw Stekiel
Naveen Kaje
Hasnain Virk
Mirela Chirica
Ari Parkkila
Marcus Chang
Kevin Bracey