It will be too hard to try to intercept and continue from a trapped
error once error functions are marked [[noreturn]], so make the error
return tests conditional on error trapping being disabled.
1. Add flash config files.
2. Flash used is MX25U3235F, include information for this
device in the flash config file
Signed-off-by: Mahesh Mahadevan <mahesh.mahadevan@nxp.com>
mbed.h was added in test, via greentea and utest header files. 'mbed.h' is removed
from header files and required header file and namespace is added to CPP/C files
Static Thread methods and signal methods have been deprecated. Remove
all references in the main code, and most of the tests. Some tests of
the deprecated APIs themselves remain.
This is fix for issue 8368.
Test is causing some problems on `REALTEK_RTL8195AM` and `ARM` compiler. There is some kind of memory issue. Probably there is not enough memory space for global data provided by the test. Data definitions have been moved into test function body so, they will land on stack. With this fix the test works on `REALTEK_RTL8195AM/ARM`.
Increase delta to 500 us. This value is still short enough to detect
incorrect behavior of the sleep_manager_can_deep_sleep_test_check() fun,
but allows the targets with low LP timer accuracy to pass, i.e.
NUCLEO_F429ZI.
You are allowed in POSIX / ANSI C to read and write on the same stream, but you
have to do an fseek in between read and write call (getc->fseek->putc)
Thanks @Alex-EEE for sharing the fix: https://github.com/ARMmbed/mbed-os/pull/7749
Added test case for verification of the behavior
Heap statistics are used for analysing heap stats, but it doesn't tell anything
about real heap usage or malloc overheads. Adding `overhead_size` element
will help users to get the real heap usage.
There is no problem with this test during the morph, but some issue has been noticed while testing new Jenkins CI in Oulu on NRF52_DK.
I was able to reproduce the issue locally. The difference between morph and local run is that CPU statistics are enabled on morph. This makes the difference and test passes.
The sleep test case perform sleep for 100 us, 200 us, ... ,1000 us in loop (us ticker wakes the board) and verifies if sleep time matches the assumption.
I got the following results:
sleep wake-up after
100 us ~100 us ok
200 us ~200 us ok
300 us ~300 us ok
400 us ~400 us ok
500 us ~14 us (??)
When requested sleep time is equal to 500 us some unexpected interrupt occurs which wakeup the board and force the test to fail.
Register state just after exit from sleep:
Control and State Register: 0x00400000 (ISRPENDING - Interrupt pending flag is set).
NVIC Interrupt Set-pending Register[0]: 0x00000004 (UARTE0_UART0_IRQn) or 0x00000200 (TIMER1_IRQn - timer used by us ticker).
UART interrupt is generated because of green-tea transmission. We know that it is performed while test is executed since we need to wait before going into deep-sleep since otherwise the transmission will be broken. So to take care of UART interrupt we need to wait before sleep test in the same way like it is done in deep-sleep test.