In case the target supports a page size of 1 byte, i.e. is able to
program flash 1 byte at a time, which is the case of STM32 F4 targets,
there is no reason for flash_device.program to return an error when
trying to write on an "unaligned" address.
This test exercises ticker API
- init should be executed just once
- read timestamp
Set interrupt should be tested via upper layer, as it does not provide
API to change handler that is invoked in the ISR ticker handler.
The test assumed that data written to flash would be memory mapped
and directly accessible. On some platform this is not the case
and data has to read back through an explicit read command.
The test has been changed to use the flash read command instead
of direct memory access.
2 test cases added, one for event in the past, one for event in future but very close
to the current time, thus once is set, it is already in the past, and we fire
interrupt immediately.
1) mbed-os-tests-mbedmicro-rtos-mbed-basic tests use to fail when run in loop
after 20-25, This was because the stack used by test application was in range of
744-840 bytes. So bumped the stack size to 1024 bytes.
2) Corrected the assert and taken out the assert which was not required.
In the new approach the host controls the device activity when the test
should start, finish and pass/fail status is send to device. Also deprecate
the test cases which can't accurately test.
Initialize all values of timeinfo in make_time_info. This prevents
the field 'tm_isdst' from getting inadvertently set to 1 causing
time to be off by 1 hour.
The use of mktime was causing a fault when called in interrupt handler because on GCC it lock the mutex protecting the environment, To overcome this issue, this patch add dedicated routine to convert a time_t into a tm and vice versa.
In the process mktime has been optimized and is now an order of magnitude faster than the routines present in the C library.
This test was removed because of its memory footprint.
Most of the memory consummed by the test itself was related to the instantion of test cases in RAM.
With the introduction of case_t which allows tests cases to live in FLASH, the memory footprint has been drastically reduced (860 bytes of RAM saved) and the ticker test can be reintroduced in the code base.
This is temporary, as this test does not fit to some 16kB RAM devices. This requires few more steps: some small devices are using big async HAL structures, RTX changes increased the RAM footprint, plus this test seems to be too big. With all these, it won't fit in RAM regions for some devices.
Jimmy Brisson
Martin Kojtal
Maciej Bocianski
Laurent MEUNIER
Bartek Szatkowski
YarivCol
Christopher Haster
Marcus Chang
Shrikant Tudavekar
Chris
Russ Butler
adustm
Sam Grove
Vincent Coubard
Anna Bridge