Commit Graph

22 Commits (1a14b9705a0c935068aecf5eae955a66729ba090)

Author SHA1 Message Date
jeromecoutant 482396ce7d FLASH test: skip test if test region overlaps code 2019-01-04 16:50:54 +01:00
Russ Butler caa7b93921 Rename lock functions and classes
Invert the name of the lock functions and classes so you are not
locking a negative.
2018-11-27 09:29:32 +00:00
Russ Butler 1821d37621 Overhaul MPU for new requirements
Make the following changes:
-Allow a vector specific ARM MPU driver by defining MBED_MPU_CUSTOM
-Allow ROM address to be configured for ARMv7-M devices by
    setting the define MBED_MPU_ROM_END
-Add ROM write protection
    -Add new functions and lock
    -enable at boot
    -disable during flash programming
2018-11-27 09:29:32 +00:00
Russ Butler c0ff98614a Disable the MPU when flashing
When programming flash using the FlashIAP API allow execution from
ram. Many devices require flashing to be done from RAM.

Also allow execution from ram when running the low level flash tests.
2018-11-27 09:29:31 +00:00
Martin Kojtal e52bb68f93 tests: astyle fix
All tests should comply to our coding standard now
2018-08-03 10:23:38 +01:00
David Saada 9e5efbcfd5 Fix flash_program_page API in LPC boards.
This API allocates a program buffer of 256 on the stack to ensure alignment.
However, FlashIAP driver already ensures this alignment of the user data.
2018-06-12 15:09:05 +03:00
Przemyslaw Stekiel e7fa5fc599 tests-mbed_hal-flash: optimieze time_cpu_cycles() function
This function should perform instruction cycles count in critical section.
Additionally remove redundant code.
2018-05-25 12:33:42 -05:00
Przemyslaw Stekiel be098399a8 tests-mbed_hal-flash: Remove 5% extra tolerance for NRF52_DK
NRF52_DK is now based on fast and accurate 1MHz counter.
2018-05-25 12:33:42 -05:00
Marcus Chang 5910cd7546 Re-enable flash clock test for NRF52 but with higher tolerance
The flash clock test is disabled for the NRF52 series. This change
re-enables the test but with a higher tolerance to accommodate the
high jitter on the current ticker implementation.
2018-04-26 09:33:43 -07:00
Cruz Monrreal II 9f6301333b Disabled flash clock and cache test for NRF52 MCUs.
This is meant to be a temporary fix until the issue has been root caused, and Jenkins CI is no longer intermittently failing.
2018-03-19 11:13:22 -05:00
Shrikant Tudavekar efe4600cee measure the time over a longer range 2018-02-26 18:03:08 -06:00
Marcus Chang d60bed2da9 Increase clock tolerance in Flash HAL test
The current 0.1% clock tolerance is too small for certain platforms
which natural variance is larger than this. This commit increases the
tolerance to 0.5% instead.

Sample output from time_cpu_cycles called repeatedly in init,
before running any flash tests:

[1515706585.63][CONN][RXD] diff: 49316
[1515706585.69][CONN][RXD] diff: 49256
[1515706585.75][CONN][RXD] diff: 49286
[1515706585.81][CONN][RXD] diff: 49256
[1515706585.87][CONN][RXD] diff: 49225
[1515706585.94][CONN][RXD] diff: 49286
[1515706585.99][CONN][RXD] diff: 49317
[1515706586.06][CONN][RXD] diff: 49255
[1515706586.12][CONN][RXD] diff: 49286
[1515706586.18][CONN][RXD] diff: 49285
[1515706586.24][CONN][RXD] diff: 49286
[1515706586.31][CONN][RXD] diff: 49347
[1515706586.36][CONN][RXD] diff: 49347
[1515706586.43][CONN][RXD] diff: 49286
[1515706586.49][CONN][RXD] diff: 49286
[1515706586.55][CONN][RXD] diff: 49256
[1515706586.61][CONN][RXD] diff: 49286
[1515706586.68][CONN][RXD] diff: 49346
[1515706586.74][CONN][RXD] diff: 49347
[1515706586.80][CONN][RXD] diff: 49256

Notice the outliers will cause intermittent CI failures.
2018-01-11 13:44:51 -08:00
Shrikant Tudavekar 1cb41e9715 use default macro for armcc 2017-09-12 01:00:45 -05:00
Shrikant Tudavekar 45202df55e gaurd thumb instruction for amrc6 2017-09-11 20:09:43 -05:00
Marcus Chang 299c7f24ac mbed-hal: Fixed flash test
The test assumed that data written to flash would be memory mapped
and directly accessible. On some platform this is not the case
and data has to read back through an explicit read command.

The test has been changed to use the flash read command instead
of direct memory access.
2017-07-19 14:32:39 +01:00
Chris 8365d9d00d Remove volatile 2017-06-30 22:44:05 +01:00
Chris ed8b378c6e Code tidy 2017-06-30 22:09:47 +01:00
Chris 562a548053 Assembly based loop for timing test 2017-06-30 20:33:58 +01:00
Chris 92e4a1faf7 Fix timing issues found in "Flash - clock and cache test"
ARMCC seemed to be inlining time_cpu_cycles() but with a different number of clock cycles in the loop, GCC worked fine.
2017-06-29 09:51:44 +01:00
kl-cruz 4bb818cd97 nRF52840: Fixed flashapi test and casting issue 2017-05-17 09:21:39 +02:00
ccli8 bcae1429e5 [Greentea] Fix test code mbed-os-tests-mbed_hal-flash 2017-03-20 15:06:06 +08:00
0xc0170 4d55719321 test: add flash functional tests for flash HAL
Add tests to verify the hal port of the flash_api.
2017-02-21 14:08:23 -06:00