bsilvereagle
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ec8ac75e88
|
Replaced SPI pin definitions for K64F in SD tests
The old pin definitions were all for Port D pins, which are incorrect. These improper pin mappings caused all tests to fail.
Pin definitions were replaced with the definitions as stated here -
http://developer.mbed.org/media/uploads/sam_grove/xk64f_sensors.jpg.pagespeed.ic.RCpM8talCK.webp
Tests now pass on the K64F Sch Rev D1
|
2015-04-15 09:11:39 -04:00 |
bcostm
|
5af36d1e3b
|
[NUCLEO_L073RZ] Add target in test files
|
2015-03-16 14:44:36 +01:00 |
Przemek Wirkus
|
09c48e4081
|
Refactored names for MBED_HOSTTEST macros used in test case auto-detection
|
2015-02-11 10:37:03 +00:00 |
Przemek Wirkus
|
a4bf0cf135
|
Refactored tests for SD card peripheral
|
2015-01-27 13:44:30 +00:00 |
Martin Kojtal
|
2c2ab2cb06
|
Merge pull request #861 from NitinBhaskar/master
On-Board SD Card support for LPC11U37H_401 board
|
2015-01-26 06:46:38 +00:00 |
nitin.bhaskar.27.09@gmail.com
|
19fd60321b
|
On-Board SD Card support added, SD Card related test cases updated too
|
2015-01-24 22:57:01 +05:30 |
ZKvAH
|
466223a617
|
fix read_result always false
read_result always false when read file success
|
2015-01-24 13:38:20 +08:00 |
Przemek Wirkus
|
0c3caf8d75
|
Refactored SD card basic test
Included return value check from fopen() functions in read/write testcases
|
2015-01-12 08:39:34 +00:00 |
bcostm
|
e0e18f54d6
|
[NUCLEO_F070RB] Update tests with this target
|
2015-01-09 11:21:15 +01:00 |
Przemek Wirkus
|
3ec2247713
|
K22F: added peripheral pin definitions to SD card tests and I2C EEPROM tests
|
2015-01-08 14:06:39 +00:00 |
Masao Hamanaka
|
cf9fc3c4ac
|
Add SD function
Add SD function and tests for RZ_A1H.
|
2014-11-27 17:12:57 +09:00 |
bcostm
|
c4bac8eb8a
|
Tests: re-order and add new NUCLEO targets
|
2014-09-23 13:01:21 +02:00 |
Przemek Wirkus
|
d9fbefd373
|
Test compliance with LPC1549 and LPC11U68
|
2014-07-30 17:53:01 +01:00 |
Przemek Wirkus
|
12c7ba5ee2
|
Small refactoring for SD card tests for TARGET_K64F platform
|
2014-07-28 13:35:10 +01:00 |
Przemek Wirkus
|
ac667d6a3e
|
Added SD card and EEPROM test pins for new Freescale K20D50M platform
|
2014-07-15 10:13:20 +01:00 |
Przemek Wirkus
|
a7d1228723
|
Added new NUCLEO boards definitions to general tests
|
2014-06-23 15:56:47 +01:00 |
Przemek Wirkus
|
20d2618d19
|
SD card test updated with 11U68 pinology
|
2014-05-20 15:05:28 +01:00 |
Przemek Wirkus
|
55c4d96efc
|
Added NUCLEO L053R8 to SD test definitions
|
2014-05-16 11:16:47 +01:00 |
Przemek Wirkus
|
23b696133a
|
Added LPC2368 to SD card and TMP102 tests
|
2014-04-30 13:57:07 +01:00 |
Przemek Wirkus
|
4927a9d7e3
|
Small updates for test MBED_A12, MBED_A19, MBED_A25 (SD, EEPROM, EEPROM)
|
2014-04-24 13:48:39 +01:00 |
dinau
|
86ee511c80
|
STM32F0-Discovery (STM32F051R8) initial port
|
2014-03-21 20:23:13 +09:00 |
tkuyucu
|
026b6610a8
|
Merge remote-tracking branch 'upstream/master'
Conflicts:
libraries/tests/mbed/portinout/main.cpp
libraries/tests/mbed/portout_portin/main.cpp
libraries/tests/mbed/sd/main.cpp
libraries/tests/mbed/spi_slave/main.cpp
workspace_tools/targets.py
workspace_tools/toolchains/arm.py
workspace_tools/toolchains/gcc.py
workspace_tools/toolchains/iar.py
|
2014-02-07 11:04:50 +01:00 |
tkuyucu
|
29560a3195
|
SPI and I2C will accept unsupported frequencies and match them with the closest available frequency instead of generating an error.
Sleep is now implemented (deepsleep will cause nrf to work in System OFF mode).
|
2014-01-10 14:21:43 +01:00 |
Bogdan Marinescu
|
8ee4396f01
|
Ported 'sd' test to the Nucleo board
|
2013-12-11 18:50:35 +02:00 |
Emilio Monti
|
a5e0438a97
|
Add Freescale KL25Z
|
2013-02-26 14:57:42 +00:00 |
Emilio Monti
|
5c20760685
|
Initial commit of the mbed libraries and tools
|
2013-02-18 15:32:11 +00:00 |