As of 722628be02, the "remainder" configuration
also uses the default location near the end of flash. Which makes the two tests
nearly identical with the exception that the "last two sectors" test correctly
handles parts with a low (possibly 1:1) erase size to program size ratio.
Therefore, change the "remainder" test to instead be a "default" test that uses
the tdb_internal_address/size values, so that it
a.) tests something meaningfully different and
b.) tests using the custom TDB address/size values if they are provided.
c.) functions correctly on devices where the default sector-based size computation
does not work (e.g. because of the low erase size to program size ratio)
and therefore a custom location and size has been specified.
The is_conf_tdb_internal variable is unused and therefore removed.
The QSPI spec allows alt to be any size that is a multiple of the
number of data lines. For example, Micron's N25Q128A uses only a
single alt cycle for all read modes (1, 2, or 4 bits depending on
how many data lines are in use).
Thus far the default position has been after the application plus two
spare sectors. For simplicity and to have a predictable location for the
TDBStore with the default configuration the location is now switched to
the end of the flash. Two last sectors to be exact.
Macro which restricted compilation to GCC_ARM is removed.
Existing read_write() test is amended to call stat() and check that correct size is returned.
In addition, prevent FS tests from running on internal flash,
due to the fact that file system on internal flash is not part of
our offering (TDBStore should be used there instead).
This commit fixes the failure in the "Direct access to device key" test,
when working with internal flash components, whose erase size to program
size ratio is small. In such cases, the last two sectors are not large
enough to store the device key.
Due to targets enhancement some boards failed the general block device tests for flashiap component,
The fails were due to boards containing inconsistent sector sizes.
The tests were modified but should be improved to address the problem.
Rand() function issues were fixed.
Random number generation in case of IAR 8, requires TLS support.
Thread local storage is not part of Mbed OS, test is updated to have random
numbers sparse, but in future random number creation should be moved to main
thread, or use some other logic for randomization instead of rand() call.
All tests will run for each storage component available on device excapt for test_get_type_functionality that will run once on the default blockdevice.
Change KVStore API tests to run only on K64F, these tests check the KVStore functionality without actually testing the board's storage,
Thus they should produce the same results for each device they run on.
K64F was selected for no special technical reason but only because of it being available and convenient to use.
This is achieved by checking whether the board can allocate a certain memory
chunk (threshold) and skipping the test if it can't.
This should prevent these boards from failing in CI.
- Remove require integrity flag (authentication) - always authenticate
- Use RBP KV to store CMAC also in write once case
- Allow removing a key if reading it failed on RBP authentication error
- Disable SecureStore if user disables MBED TLS AES CTR or CMAC
Martin Kojtal
Kyle Kearney
Matthew Macovsky
Chun-Chieh Li
Veijo Pesonen
Michal Paszta
int_szyk
jeromecoutant
Qinghao Shi
Yossi Levy
Amir Cohen
Michael Schwarcz
Cruz Monrreal
David Saada
offirko
Deepika
Amir Cohen