mirror of https://github.com/ARMmbed/mbed-os.git
Added block device test for SD driver
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/*
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* mbed Microcontroller Library
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* Copyright (c) 2006-2016 ARM Limited
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*
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* Licensed under the Apache License, Version 2.0 (the "License");
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* you may not use this file except in compliance with the License.
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* You may obtain a copy of the License at
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*
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* http://www.apache.org/licenses/LICENSE-2.0
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*
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* Unless required by applicable law or agreed to in writing, software
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* distributed under the License is distributed on an "AS IS" BASIS,
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* WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
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* See the License for the specific language governing permissions and
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* limitations under the License.
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*
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*/
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/* The following copyright notice is reproduced from the glibc project
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* REF_LICENCE_GLIBC
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*
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* Copyright (C) 1991, 1992 Free Software Foundation, Inc.
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* This file is part of the GNU C Library.
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*
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* The GNU C Library is free software; you can redistribute it and/or
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* modify it under the terms of the GNU Library General Public License as
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* published by the Free Software Foundation; either version 2 of the
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* License, or (at your option) any later version.
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*
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* The GNU C Library is distributed in the hope that it will be useful,
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* but WITHOUT ANY WARRANTY; without even the implied warranty of
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* MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the GNU
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* Library General Public License for more details.
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*
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* You should have received a copy of the GNU Library General Public
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* License along with the GNU C Library; see the file COPYING.LIB. If
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* not, write to the Free Software Foundation, Inc., 675 Mass Ave,
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* Cambridge, MA 02139, USA.
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*/
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/** @file main.cpp Basic SD Driver Test
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*/
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#include "mbed.h"
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#include "greentea-client/test_env.h"
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#include "unity.h"
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#include "utest.h"
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#include "SDBlockDevice.h"
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#include <stdlib.h>
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using namespace utest::v1;
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#define TEST_BLOCK_COUNT 10
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#define TEST_ERROR_MASK 16
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#define TEST_BLOCK_SIZE 2048
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const struct {
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const char *name;
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bd_size_t (BlockDevice::*method)() const;
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} ATTRS[] = {
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{"read size", &BlockDevice::get_read_size},
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{"program size", &BlockDevice::get_program_size},
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{"erase size", &BlockDevice::get_erase_size},
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{"total size", &BlockDevice::size},
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};
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void test_read_write() {
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SDBlockDevice sd(MBED_CONF_SD_SPI_MOSI, MBED_CONF_SD_SPI_MISO, MBED_CONF_SD_SPI_CLK, MBED_CONF_SD_SPI_CS);
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int err = sd.init();
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TEST_ASSERT_EQUAL(0, err);
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err = sd.frequency(25000000);
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TEST_ASSERT_EQUAL(0, err);
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for (unsigned a = 0; a < sizeof(ATTRS)/sizeof(ATTRS[0]); a++) {
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static const char *prefixes[] = {"", "k", "M", "G"};
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for (int i = 3; i >= 0; i--) {
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bd_size_t size = (sd.*ATTRS[a].method)();
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if (size >= (1ULL << 10*i)) {
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printf("%s: %llu%sbytes (%llubytes)\n",
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ATTRS[a].name, size >> 10*i, prefixes[i], size);
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break;
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}
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}
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}
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bd_size_t erase_size = sd.get_erase_size();
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bd_size_t block_size = erase_size > TEST_BLOCK_SIZE ? erase_size : TEST_BLOCK_SIZE;
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uint8_t *write_block = new uint8_t[block_size];
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uint8_t *read_block = new uint8_t[block_size];
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uint8_t *error_mask = new uint8_t[TEST_ERROR_MASK];
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unsigned addrwidth = ceil(log(float(sd.size()-1)) / log(float(16)))+1;
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for (int b = 0; b < TEST_BLOCK_COUNT; b++) {
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// Find a random block
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bd_addr_t block = (rand()*block_size) % sd.size();
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// Use next random number as temporary seed to keep
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// the address progressing in the pseudorandom sequence
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unsigned seed = rand();
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// Fill with random sequence
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srand(seed);
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for (bd_size_t i = 0; i < block_size; i++) {
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write_block[i] = 0xff & rand();
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}
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// Write, sync, and read the block
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printf("test %0*llx:%llu...\n", addrwidth, block, block_size);
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err = sd.erase(block, block_size);
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TEST_ASSERT_EQUAL(0, err);
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err = sd.program(write_block, block, block_size);
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TEST_ASSERT_EQUAL(0, err);
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printf("write %0*llx:%llu ", addrwidth, block, block_size);
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for (int i = 0; i < 16; i++) {
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printf("%02x", write_block[i]);
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}
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printf("...\n");
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err = sd.read(read_block, block, block_size);
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TEST_ASSERT_EQUAL(0, err);
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printf("read %0*llx:%llu ", addrwidth, block, block_size);
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for (int i = 0; i < 16; i++) {
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printf("%02x", read_block[i]);
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}
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printf("...\n");
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// Find error mask for debugging
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memset(error_mask, 0, TEST_ERROR_MASK);
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bd_size_t error_scale = block_size / (TEST_ERROR_MASK*8);
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srand(seed);
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for (bd_size_t i = 0; i < TEST_ERROR_MASK*8; i++) {
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for (bd_size_t j = 0; j < error_scale; j++) {
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if ((0xff & rand()) != read_block[i*error_scale + j]) {
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error_mask[i/8] |= 1 << (i%8);
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}
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}
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}
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printf("error %0*llx:%llu ", addrwidth, block, block_size);
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for (int i = 0; i < 16; i++) {
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printf("%02x", error_mask[i]);
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}
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printf("\n");
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// Check that the data was unmodified
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srand(seed);
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for (bd_size_t i = 0; i < block_size; i++) {
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TEST_ASSERT_EQUAL(0xff & rand(), read_block[i]);
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}
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}
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err = sd.deinit();
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TEST_ASSERT_EQUAL(0, err);
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}
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// Test setup
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utest::v1::status_t test_setup(const size_t number_of_cases) {
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GREENTEA_SETUP(30, "default_auto");
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return verbose_test_setup_handler(number_of_cases);
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}
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Case cases[] = {
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Case("Testing read write random blocks", test_read_write),
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};
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Specification specification(test_setup, cases);
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int main() {
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return !Harness::run(specification);
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}
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