mbed-os/TESTS/block_device/basic/basic.cpp

180 lines
5.7 KiB
C++

/*
* mbed Microcontroller Library
* Copyright (c) 2006-2016 ARM Limited
*
* Licensed under the Apache License, Version 2.0 (the "License");
* you may not use this file except in compliance with the License.
* You may obtain a copy of the License at
*
* http://www.apache.org/licenses/LICENSE-2.0
*
* Unless required by applicable law or agreed to in writing, software
* distributed under the License is distributed on an "AS IS" BASIS,
* WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
* See the License for the specific language governing permissions and
* limitations under the License.
*
*/
/* The following copyright notice is reproduced from the glibc project
* REF_LICENCE_GLIBC
*
* Copyright (C) 1991, 1992 Free Software Foundation, Inc.
* This file is part of the GNU C Library.
*
* The GNU C Library is free software; you can redistribute it and/or
* modify it under the terms of the GNU Library General Public License as
* published by the Free Software Foundation; either version 2 of the
* License, or (at your option) any later version.
*
* The GNU C Library is distributed in the hope that it will be useful,
* but WITHOUT ANY WARRANTY; without even the implied warranty of
* MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the GNU
* Library General Public License for more details.
*
* You should have received a copy of the GNU Library General Public
* License along with the GNU C Library; see the file COPYING.LIB. If
* not, write to the Free Software Foundation, Inc., 675 Mass Ave,
* Cambridge, MA 02139, USA.
*/
/** @file main.cpp Basic SD Driver Test
*/
#include "mbed.h"
#include "greentea-client/test_env.h"
#include "unity.h"
#include "utest.h"
#include "SDBlockDevice.h"
#include <stdlib.h>
using namespace utest::v1;
#define TEST_BLOCK_COUNT 10
#define TEST_ERROR_MASK 16
#define TEST_BLOCK_SIZE 2048
const struct {
const char *name;
bd_size_t (BlockDevice::*method)() const;
} ATTRS[] = {
{"read size", &BlockDevice::get_read_size},
{"program size", &BlockDevice::get_program_size},
{"erase size", &BlockDevice::get_erase_size},
{"total size", &BlockDevice::size},
};
void test_read_write() {
SDBlockDevice sd(MBED_CONF_SD_SPI_MOSI, MBED_CONF_SD_SPI_MISO, MBED_CONF_SD_SPI_CLK, MBED_CONF_SD_SPI_CS);
int err = sd.init();
TEST_ASSERT_EQUAL(0, err);
err = sd.frequency(25000000);
TEST_ASSERT_EQUAL(0, err);
for (unsigned a = 0; a < sizeof(ATTRS)/sizeof(ATTRS[0]); a++) {
static const char *prefixes[] = {"", "k", "M", "G"};
for (int i = 3; i >= 0; i--) {
bd_size_t size = (sd.*ATTRS[a].method)();
if (size >= (1ULL << 10*i)) {
printf("%s: %llu%sbytes (%llubytes)\n",
ATTRS[a].name, size >> 10*i, prefixes[i], size);
break;
}
}
}
bd_size_t erase_size = sd.get_erase_size();
bd_size_t block_size = erase_size > TEST_BLOCK_SIZE ? erase_size : TEST_BLOCK_SIZE;
uint8_t *write_block = new uint8_t[block_size];
uint8_t *read_block = new uint8_t[block_size];
uint8_t *error_mask = new uint8_t[TEST_ERROR_MASK];
unsigned addrwidth = ceil(log(float(sd.size()-1)) / log(float(16)))+1;
for (int b = 0; b < TEST_BLOCK_COUNT; b++) {
// Find a random block
bd_addr_t block = (rand()*block_size) % sd.size();
// Use next random number as temporary seed to keep
// the address progressing in the pseudorandom sequence
unsigned seed = rand();
// Fill with random sequence
srand(seed);
for (bd_size_t i = 0; i < block_size; i++) {
write_block[i] = 0xff & rand();
}
// Write, sync, and read the block
printf("test %0*llx:%llu...\n", addrwidth, block, block_size);
err = sd.erase(block, block_size);
TEST_ASSERT_EQUAL(0, err);
err = sd.program(write_block, block, block_size);
TEST_ASSERT_EQUAL(0, err);
printf("write %0*llx:%llu ", addrwidth, block, block_size);
for (int i = 0; i < 16; i++) {
printf("%02x", write_block[i]);
}
printf("...\n");
err = sd.read(read_block, block, block_size);
TEST_ASSERT_EQUAL(0, err);
printf("read %0*llx:%llu ", addrwidth, block, block_size);
for (int i = 0; i < 16; i++) {
printf("%02x", read_block[i]);
}
printf("...\n");
// Find error mask for debugging
memset(error_mask, 0, TEST_ERROR_MASK);
bd_size_t error_scale = block_size / (TEST_ERROR_MASK*8);
srand(seed);
for (bd_size_t i = 0; i < TEST_ERROR_MASK*8; i++) {
for (bd_size_t j = 0; j < error_scale; j++) {
if ((0xff & rand()) != read_block[i*error_scale + j]) {
error_mask[i/8] |= 1 << (i%8);
}
}
}
printf("error %0*llx:%llu ", addrwidth, block, block_size);
for (int i = 0; i < 16; i++) {
printf("%02x", error_mask[i]);
}
printf("\n");
// Check that the data was unmodified
srand(seed);
for (bd_size_t i = 0; i < block_size; i++) {
TEST_ASSERT_EQUAL(0xff & rand(), read_block[i]);
}
}
err = sd.deinit();
TEST_ASSERT_EQUAL(0, err);
}
// Test setup
utest::v1::status_t test_setup(const size_t number_of_cases) {
GREENTEA_SETUP(30, "default_auto");
return verbose_test_setup_handler(number_of_cases);
}
Case cases[] = {
Case("Testing read write random blocks", test_read_write),
};
Specification specification(test_setup, cases);
int main() {
return !Harness::run(specification);
}