mbed-os/TESTS/mbed_hal
Przemyslaw Stekiel c181003702 tests-mbed_hal-common_tickers: Fix increment test case implementation
In case when base tick count is different than next tick count check first if the difference is equal to 1 tick (this is what we are looking for) if not then decrease the tick count.

Repeat counting process few times before incrementing the number of cycles in case when base tick count is equal to next tick count.
2018-06-05 15:05:18 +01:00
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common_tickers tests-mbed_hal-common_tickers: Fix increment test case implementation 2018-06-05 15:05:18 +01:00
common_tickers_freq tests-mbed_hal-common_tickers_freq : correct overflowCounter value 2018-05-25 12:22:06 -05:00
critical_section Reorganize TARGET_MCU_NRF51822_UNIFIED directories 2018-05-08 10:10:01 -07:00
flash/functional_tests tests-mbed_hal-flash: optimieze time_cpu_cycles() function 2018-05-25 12:33:42 -05:00
lp_ticker Fix missmatch between feature branches and new CMSIS 2018-05-25 13:04:23 -05:00
rtc Rename LOWPOWERTIMER to LPTICKER 2018-05-25 13:06:56 -05:00
rtc_reset tests-mbed_hal-rtc_reset: Add ack from the device after each command is executed 2018-05-25 12:52:02 -05:00
rtc_time Add tests for extended RTC. 2017-12-05 07:53:41 +01:00
rtc_time_conv RTC time conversion test - reduce number of tested years in order to reduce test execution time. 2018-01-08 10:14:54 +01:00
sleep Disable sleep tests as they are unstable 2018-05-27 23:31:20 -05:00
sleep_manager test: add sleep manager tests 2017-09-07 15:35:07 +01:00
sleep_manager_racecondition Skip higher level ticker tests for targets with stale ticker target specific drivers. 2018-05-25 12:17:49 -05:00
ticker Increase ticker test time for slower devices 2017-10-05 11:57:35 -05:00
us_ticker Add tests for ticker HAL API. 2018-05-25 12:04:32 -05:00