Maciej Bocianski fb28c41be1 enable HAL sleep test		2018-06-05 06:56:48 +02:00
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common_tickers	tests-mbed_hal-common_tickers: Fix increment test case implementation	2018-05-28 12:39:09 +02:00
common_tickers_freq	tests-mbed_hal-common_tickers_freq : correct overflowCounter value	2018-05-25 12:22:06 -05:00
critical_section	Reorganize TARGET_MCU_NRF51822_UNIFIED directories	2018-05-08 10:10:01 -07:00
flash/functional_tests	tests-mbed_hal-flash: optimieze time_cpu_cycles() function	2018-05-25 12:33:42 -05:00
lp_ticker	Fix missmatch between feature branches and new CMSIS	2018-05-25 13:04:23 -05:00
rtc	Rename LOWPOWERTIMER to LPTICKER	2018-05-25 13:06:56 -05:00
rtc_reset	tests-mbed_hal-rtc_reset: Add ack from the device after each command is executed	2018-05-25 12:52:02 -05:00
rtc_time	Add tests for extended RTC.	2017-12-05 07:53:41 +01:00
rtc_time_conv	RTC time conversion test - reduce number of tested years in order to reduce test execution time.	2018-01-08 10:14:54 +01:00
sleep	enable HAL sleep test	2018-06-05 06:56:48 +02:00
sleep_manager	test: add sleep manager tests	2017-09-07 15:35:07 +01:00
sleep_manager_racecondition	Skip higher level ticker tests for targets with stale ticker target specific drivers.	2018-05-25 12:17:49 -05:00
ticker	Increase ticker test time for slower devices	2017-10-05 11:57:35 -05:00
us_ticker	Add tests for ticker HAL API.	2018-05-25 12:04:32 -05:00