mbed-os/TESTS/mbed_hal/qspi/flash_configs/STM
Maciej Bocianski db8cee04fc qspi_hal_test refactoring
- code refactoring and preparation for enabling DPI/QPI tests
- reduced multiple test count to 4
- use common flash config header for all MX25RXX35F chips
- fix sector erase max time on N25Q128A
2018-08-29 09:32:50 +02:00
..
DISCO_F413ZH hal-qspi test: add F413ZH support 2018-08-22 15:02:12 +02:00
DISCO_L475VG_IOT01A qspi_hal_test refactoring 2018-08-29 09:32:50 +02:00