mirror of https://github.com/ARMmbed/mbed-os.git
94 lines
3.0 KiB
C++
94 lines
3.0 KiB
C++
/* mbed Microcontroller Library
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* Copyright (c) 2017-2017 ARM Limited
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*
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* Permission is hereby granted, free of charge, to any person obtaining a copy
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* of this software and associated documentation files (the "Software"), to deal
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* in the Software without restriction, including without limitation the rights
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* to use, copy, modify, merge, publish, distribute, sublicense, and/or sell
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* copies of the Software, and to permit persons to whom the Software is
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* furnished to do so, subject to the following conditions:
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*
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* The above copyright notice and this permission notice shall be included in
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* all copies or substantial portions of the Software.
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*
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* THE SOFTWARE IS PROVIDED "AS IS", WITHOUT WARRANTY OF ANY KIND, EXPRESS OR
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* IMPLIED, INCLUDING BUT NOT LIMITED TO THE WARRANTIES OF MERCHANTABILITY,
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* FITNESS FOR A PARTICULAR PURPOSE AND NONINFRINGEMENT. IN NO EVENT SHALL THE
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* AUTHORS OR COPYRIGHT HOLDERS BE LIABLE FOR ANY CLAIM, DAMAGES OR OTHER
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* LIABILITY, WHETHER IN AN ACTION OF CONTRACT, TORT OR OTHERWISE, ARISING FROM,
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* OUT OF OR IN CONNECTION WITH THE SOFTWARE OR THE USE OR OTHER DEALINGS IN THE
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* SOFTWARE.
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*/
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#include "mbed.h"
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#include "unity.h"
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#include "utest.h"
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#include "test_env.h"
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#include "atomic_usage.h"
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#include "ExhaustibleBlockDevice.h"
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#include "LittleFileSystem.h"
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using namespace utest::v1;
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#define ERASE_CYCLES 20
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#define TEST_BD_SIZE (8 * 1024)
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static uint32_t test_wear_leveling_size(uint32_t bd_size)
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{
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HeapBlockDevice hbd(bd_size, 1, 1, 512);
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ExhaustibleBlockDevice ebd(&hbd, ERASE_CYCLES);
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printf("Testing size %lu\n", bd_size);
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setup_atomic_operations(&ebd, true);
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int64_t cycles = 0;
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while (true) {
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int64_t ret = perform_atomic_operations(&ebd);
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check_atomic_operations(&ebd);
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if (-1 == ret) {
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break;
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}
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cycles++;
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TEST_ASSERT_EQUAL(cycles, ret);
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}
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printf(" Simulated flash lasted %lli cylces\n", cycles);
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return cycles;
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}
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/**
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* Check that storage life is proportional to storage size
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*
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* This test is to ensure that littlefs is properly handling wear
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* leveling. It does this by creating a simulated flash block device
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* which can be worn out and then using it until it is exhausted.
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* It then doubles the size of the block device and runs the same
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* test. If the block device with twice the size lasts at least
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* twice as long then the test passes.
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*/
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void test_wear_leveling()
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{
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uint32_t cycles_1 = test_wear_leveling_size(TEST_BD_SIZE * 1);
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uint32_t cycles_2 = test_wear_leveling_size(TEST_BD_SIZE * 2);
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TEST_ASSERT(cycles_2 > cycles_1 * 2);
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}
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Case cases[] = {
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Case("test wear leveling", test_wear_leveling),
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};
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utest::v1::status_t greentea_test_setup(const size_t number_of_cases)
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{
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GREENTEA_SETUP(60, "default_auto");
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return greentea_test_setup_handler(number_of_cases);
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}
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Specification specification(greentea_test_setup, cases, greentea_test_teardown_handler);
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int main()
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{
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Harness::run(specification);
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}
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