mbed-os/TESTS/mbed_hal
Russ Butler 9c2d758cda Restore ticker state after each test
Update the ticker common test to clean up after each case by restoring
the ticker IRQ handler. This allows tickers to function normally after
each case has completed.
2018-05-25 12:21:16 -05:00
..
common_tickers Restore ticker state after each test 2018-05-25 12:21:16 -05:00
common_tickers_freq Rename lp_us tests to common and hf to microsecond 2018-05-25 12:20:09 -05:00
critical_section Reorganize TARGET_MCU_NRF51822_UNIFIED directories 2018-05-08 10:10:01 -07:00
flash/functional_tests Re-enable flash clock test for NRF52 but with higher tolerance 2018-04-26 09:33:43 -07:00
lp_ticker tests-mbed_hal-lp_ticker : increase time before deep sleep 2018-05-25 12:21:16 -05:00
rtc_time Add tests for extended RTC. 2017-12-05 07:53:41 +01:00
rtc_time_conv RTC time conversion test - reduce number of tested years in order to reduce test execution time. 2018-01-08 10:14:54 +01:00
sleep tests-mbed_hal-sleep: decrease delay when testing if us ticker is disabled in deep-sleep mode. 2018-05-25 12:04:32 -05:00
sleep_manager test: add sleep manager tests 2017-09-07 15:35:07 +01:00
sleep_manager_racecondition Skip higher level ticker tests for targets with stale ticker target specific drivers. 2018-05-25 12:17:49 -05:00
ticker Increase ticker test time for slower devices 2017-10-05 11:57:35 -05:00
us_ticker Add tests for ticker HAL API. 2018-05-25 12:04:32 -05:00