mbed-os/TESTS/mbed_hal_fpga_ci_test_shield/uart/main.cpp

360 lines
13 KiB
C++

/*
* Copyright (c) 2019, Arm Limited and affiliates.
* SPDX-License-Identifier: Apache-2.0
*
* Licensed under the Apache License, Version 2.0 (the "License");
* you may not use this file except in compliance with the License.
* You may obtain a copy of the License at
*
* http://www.apache.org/licenses/LICENSE-2.0
*
* Unless required by applicable law or agreed to in writing, software
* distributed under the License is distributed on an "AS IS" BASIS,
* WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
* See the License for the specific language governing permissions and
* limitations under the License.
*/
#if !DEVICE_SERIAL
#error [NOT_SUPPORTED] SERIAL not supported for this target
#elif !COMPONENT_FPGA_CI_TEST_SHIELD
#error [NOT_SUPPORTED] FPGA CI Test Shield is needed to run this test
#elif !defined(TARGET_FF_ARDUINO) && !defined(MBED_CONF_TARGET_DEFAULT_FORM_FACTOR)
#error [NOT_SUPPORTED] Test not supported for this form factor
#else
#include "utest/utest.h"
#include "unity/unity.h"
#include "greentea-client/test_env.h"
#include "platform/mbed_critical.h"
using namespace utest::v1;
#include <stdlib.h>
#include "UARTTester.h"
#include "pinmap.h"
#include "test_utils.h"
#include "serial_api.h"
#include "us_ticker_api.h"
#define PUTC_REPS 16
#define GETC_REPS 16
// In the UART RX test, the request for the FPGA to start sending data is sent
// first. Then the execution is blocked at serial_getc() call. Since the DUT
// is not ready to receive UART data instantly after the request, the start of
// the actual transmission has to be dalyed.
// A measured delay for NUCLEO_F070RB is 193 us.
#define TX_START_DELAY_NS 250000
UARTTester tester(DefaultFormFactor::pins(), DefaultFormFactor::restricted_pins());
typedef struct {
serial_t *ser;
int *rx_buff;
uint32_t rx_cnt;
int *tx_buff;
uint32_t tx_cnt;
} serial_test_data_t;
static void test_irq_handler(uint32_t id, SerialIrq event)
{
serial_test_data_t *td = (serial_test_data_t *)id;
int c = 0x01; // arbitrary, non-zero value
if (event == RxIrq) {
c = serial_getc(td->ser);
core_util_critical_section_enter();
if (td->rx_cnt < GETC_REPS) {
td->rx_buff[td->rx_cnt] = c;
td->rx_cnt++;
}
core_util_critical_section_exit();
} else if (event == TxIrq) {
core_util_critical_section_enter();
if (td->tx_cnt < PUTC_REPS) {
c = td->tx_buff[td->tx_cnt];
td->tx_cnt++;
}
core_util_critical_section_exit();
// Send either one of tx_buff[] values or 0x01.
serial_putc(td->ser, c);
}
}
static void uart_test_common(int baudrate, int data_bits, SerialParity parity, int stop_bits, PinName tx, PinName rx, PinName cts = NC, PinName rts = NC)
{
// The FPGA CI shield only supports None, Odd & Even.
// Forced parity is not supported on Atmel, Freescale, Nordic & STM targets.
MBED_ASSERT(parity != ParityForced1 && parity != ParityForced0);
// STM-specific constraints
// Only 7, 8 & 9 data bits.
MBED_ASSERT(data_bits >= 7 && data_bits <= 9);
// Only Odd or Even parity for 7 data bits.
if (data_bits == 7) {
MBED_ASSERT(parity != ParityNone);
}
// Limit the actual TX & RX chars to 8 bits for this test.
int test_buff_bits = data_bits < 8 ? data_bits : 8;
// start_bit + data_bits + parity_bit + stop_bits
int packet_bits = 1 + data_bits + stop_bits + (parity == ParityNone ? 0 : 1);
us_timestamp_t packet_tx_time = 1000000 * packet_bits / baudrate;
const ticker_data_t *const us_ticker = get_us_ticker_data();
bool use_flow_control = (cts != NC && rts != NC) ? true : false;
// Remap pins for test
tester.reset();
tester.pin_map_set(tx, MbedTester::LogicalPinUARTRx);
tester.pin_map_set(rx, MbedTester::LogicalPinUARTTx);
if (use_flow_control) {
tester.pin_map_set(cts, MbedTester::LogicalPinUARTRts);
tester.pin_map_set(rts, MbedTester::LogicalPinUARTCts);
}
// Initialize mbed UART pins
serial_t serial;
serial_init(&serial, tx, rx);
serial_baud(&serial, baudrate);
serial_format(&serial, data_bits, parity, stop_bits);
#if DEVICE_SERIAL_FC
if (use_flow_control) {
serial_set_flow_control(&serial, FlowControlRTSCTS, rts, cts);
} else {
serial_set_flow_control(&serial, FlowControlNone, NC, NC);
}
#endif
// Reset tester stats and select UART
tester.peripherals_reset();
tester.select_peripheral(MbedTester::PeripheralUART);
// Configure UART module
tester.set_baud((uint32_t)baudrate);
tester.set_bits((uint8_t)data_bits);
tester.set_stops((uint8_t)stop_bits);
switch (parity) {
case ParityOdd:
tester.set_parity(true, true);
break;
case ParityEven:
tester.set_parity(true, false);
break;
case ParityNone:
default:
tester.set_parity(false, false);
break;
}
if (use_flow_control) {
tester.cts_deassert_delay(0);
}
int rx_buff[GETC_REPS] = {};
int tx_buff[PUTC_REPS] = {};
volatile serial_test_data_t td = {
&serial,
rx_buff,
0,
tx_buff,
0
};
uint32_t checksum = 0;
// DUT TX / FPGA RX
int tx_val;
tester.rx_start();
for (uint32_t reps = 1; reps <= PUTC_REPS; reps++) {
tx_val = rand() % (1 << test_buff_bits);
checksum += tx_val;
serial_putc(&serial, tx_val);
us_timestamp_t end_ts = ticker_read_us(us_ticker) + 2 * packet_tx_time;
while (tester.rx_get_count() != reps && ticker_read_us(us_ticker) <= end_ts) {
// Wait (no longer than twice the time of one packet transfer) for
// the FPGA to receive data and update the byte counter.
}
TEST_ASSERT_EQUAL_UINT32(reps, tester.rx_get_count());
TEST_ASSERT_EQUAL(0, tester.rx_get_parity_errors());
TEST_ASSERT_EQUAL(0, tester.rx_get_stop_errors());
TEST_ASSERT_EQUAL(0, tester.rx_get_framing_errors());
TEST_ASSERT_EQUAL_UINT32(checksum, tester.rx_get_checksum());
TEST_ASSERT_EQUAL(tx_val, tester.rx_get_data());
}
tester.rx_stop();
// DUT RX / FPGA TX
// serial_getc() may return 16-bit as well as 8-bit value cast to an int.
// Use a random initial value, but make sure it is low enouth,
// so the FPGA will not overflow 8 bits when incrementing it.
uint16_t tester_buff = rand() % ((1 << test_buff_bits) - GETC_REPS);
tester.tx_set_next(tester_buff);
tester.tx_set_count(GETC_REPS);
if (!use_flow_control) {
tester.tx_set_delay(TX_START_DELAY_NS);
}
tester.tx_start(use_flow_control);
for (int i = 0; i < GETC_REPS; i++) {
rx_buff[i] = serial_getc(&serial);
}
tester.tx_stop();
for (int i = 0; i < GETC_REPS; tester_buff++, i++) {
TEST_ASSERT_EQUAL(tester_buff, rx_buff[i]);
}
serial_irq_handler(&serial, test_irq_handler, (uint32_t) &td);
// DUT TX (IRQ) / FPGA RX
tx_val = rand() % ((1 << test_buff_bits) - PUTC_REPS);
for (size_t i = 0; i < PUTC_REPS; tx_val++, i++) {
td.tx_buff[i] = tx_val;
checksum += tx_val;
}
tester.rx_start();
core_util_critical_section_enter();
td.tx_cnt = 0;
// Enable only the TX IRQ.
serial_irq_set(&serial, TxIrq, 1);
core_util_critical_section_exit();
while (core_util_atomic_load_u32(&td.tx_cnt) != PUTC_REPS) {
// Wait until the last byte is written to UART TX reg.
};
core_util_critical_section_enter();
serial_irq_set(&serial, TxIrq, 0);
core_util_critical_section_exit();
us_timestamp_t end_ts = ticker_read_us(us_ticker) + 2 * packet_tx_time;
while (ticker_read_us(us_ticker) <= end_ts) {
// Wait twice the time of one packet transfer for the FPGA
// to receive and process data.
};
tester.rx_stop();
TEST_ASSERT_EQUAL_UINT32(2 * PUTC_REPS, tester.rx_get_count());
TEST_ASSERT_EQUAL(0, tester.rx_get_parity_errors());
TEST_ASSERT_EQUAL(0, tester.rx_get_stop_errors());
TEST_ASSERT_EQUAL(0, tester.rx_get_framing_errors());
TEST_ASSERT_EQUAL_UINT32(checksum, tester.rx_get_checksum());
TEST_ASSERT_EQUAL(tx_val - 1, tester.rx_get_data());
// DUT RX (IRQ) / FPGA TX
// serial_getc() may return 16-bit as well as 8-bit value cast to an int.
// Use a random initial value, but make sure it is low enouth,
// so the FPGA will not overflow 8 bits when incrementing it.
tester_buff = rand() % ((1 << test_buff_bits) - GETC_REPS);
tester.tx_set_next(tester_buff);
tester.tx_set_count(GETC_REPS);
if (!use_flow_control) {
tester.tx_set_delay(TX_START_DELAY_NS);
}
core_util_critical_section_enter();
// Enable only the RX IRQ.
serial_irq_set(&serial, RxIrq, 1);
core_util_critical_section_exit();
tester.rx_start();
tester.tx_start(use_flow_control);
while (core_util_atomic_load_u32(&td.rx_cnt) != GETC_REPS) {
// Wait until the last byte is received to UART RX reg.
};
core_util_critical_section_enter();
serial_irq_set(&serial, RxIrq, 0);
core_util_critical_section_exit();
tester.tx_stop();
tester.rx_stop();
for (int i = 0; i < GETC_REPS; tester_buff++, i++) {
TEST_ASSERT_EQUAL(tester_buff, td.rx_buff[i]);
}
// Make sure TX IRQ was disabled during the last RX test.
TEST_ASSERT_EQUAL_UINT32(checksum, tester.rx_get_checksum());
TEST_ASSERT_EQUAL_UINT32(2 * PUTC_REPS, tester.rx_get_count());
// Cleanup
serial_free(&serial);
tester.reset();
}
void test_init_free(PinName tx, PinName rx, PinName cts = NC, PinName rts = NC)
{
bool use_flow_control = (cts != NC && rts != NC) ? true : false;
serial_t serial;
serial_init(&serial, tx, rx);
serial_baud(&serial, 9600);
serial_format(&serial, 8, ParityNone, 1);
#if DEVICE_SERIAL_FC
if (use_flow_control) {
serial_set_flow_control(&serial, FlowControlRTSCTS, rts, cts);
}
#endif
serial_free(&serial);
}
void test_init_free_no_fc(PinName tx, PinName rx)
{
test_init_free(tx, rx);
}
template<int BAUDRATE, int DATA_BITS, SerialParity PARITY, int STOP_BITS>
void test_common(PinName tx, PinName rx, PinName cts, PinName rts)
{
uart_test_common(BAUDRATE, DATA_BITS, PARITY, STOP_BITS, tx, rx, cts, rts);
}
template<int BAUDRATE, int DATA_BITS, SerialParity PARITY, int STOP_BITS>
void test_common_no_fc(PinName tx, PinName rx)
{
uart_test_common(BAUDRATE, DATA_BITS, PARITY, STOP_BITS, tx, rx);
}
Case cases[] = {
// Every set of pins from every peripheral.
Case("init/free, FC off", all_ports<UARTNoFCPort, DefaultFormFactor, test_init_free_no_fc>),
// One set of pins from every peripheral.
Case("basic, 9600, 8N1, FC off", all_peripherals<UARTNoFCPort, DefaultFormFactor, test_common_no_fc<9600, 8, ParityNone, 1> >),
// One set of pins from one peripheral.
// baudrate
Case("19200, 8N1, FC off", one_peripheral<UARTNoFCPort, DefaultFormFactor, test_common_no_fc<19200, 8, ParityNone, 1> >),
Case("38400, 8N1, FC off", one_peripheral<UARTNoFCPort, DefaultFormFactor, test_common_no_fc<38400, 8, ParityNone, 1> >),
Case("115200, 8N1, FC off", one_peripheral<UARTNoFCPort, DefaultFormFactor, test_common_no_fc<115200, 8, ParityNone, 1> >),
// stop bits
Case("9600, 8N2, FC off", one_peripheral<UARTNoFCPort, DefaultFormFactor, test_common_no_fc<9600, 8, ParityNone, 2> >),
#if DEVICE_SERIAL_FC
// Every set of pins from every peripheral.
Case("init/free, FC on", all_ports<UARTPort, DefaultFormFactor, test_init_free>),
// One set of pins from every peripheral.
Case("basic, 9600, 8N1, FC on", all_peripherals<UARTPort, DefaultFormFactor, test_common<9600, 8, ParityNone, 1> >),
// One set of pins from one peripheral.
// baudrate
Case("19200, 8N1, FC on", one_peripheral<UARTPort, DefaultFormFactor, test_common<19200, 8, ParityNone, 1> >),
Case("38400, 8N1, FC on", one_peripheral<UARTPort, DefaultFormFactor, test_common<38400, 8, ParityNone, 1> >),
Case("115200, 8N1, FC on", one_peripheral<UARTPort, DefaultFormFactor, test_common<115200, 8, ParityNone, 1> >),
// data bits: not tested (some platforms support 8 bits only)
// parity
Case("9600, 8O1, FC on", one_peripheral<UARTPort, DefaultFormFactor, test_common<9600, 8, ParityOdd, 1> >),
Case("9600, 8E1, FC on", one_peripheral<UARTPort, DefaultFormFactor, test_common<9600, 8, ParityEven, 1> >),
// stop bits
Case("9600, 8N2, FC on", one_peripheral<UARTPort, DefaultFormFactor, test_common<9600, 8, ParityNone, 2> >),
#endif
};
utest::v1::status_t greentea_test_setup(const size_t number_of_cases)
{
GREENTEA_SETUP(240, "default_auto");
srand((unsigned) ticker_read_us(get_us_ticker_data()));
return greentea_test_setup_handler(number_of_cases);
}
Specification specification(greentea_test_setup, cases, greentea_test_teardown_handler);
int main()
{
Harness::run(specification);
}
#endif /* !DEVICE_SERIAL */