mbed-os/TESTS/mbed_hal
jeromecoutant 69b51dffaf tests-mbed_hal-lp_ticker : increase time before deep sleep 2018-05-25 12:21:16 -05:00
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common_tickers lp_us_tickers test: provide minor fixes after review 2018-05-25 12:20:10 -05:00
common_tickers_freq Rename lp_us tests to common and hf to microsecond 2018-05-25 12:20:09 -05:00
critical_section Reorganize TARGET_MCU_NRF51822_UNIFIED directories 2018-05-08 10:10:01 -07:00
flash/functional_tests Re-enable flash clock test for NRF52 but with higher tolerance 2018-04-26 09:33:43 -07:00
lp_ticker tests-mbed_hal-lp_ticker : increase time before deep sleep 2018-05-25 12:21:16 -05:00
rtc_time Add tests for extended RTC. 2017-12-05 07:53:41 +01:00
rtc_time_conv RTC time conversion test - reduce number of tested years in order to reduce test execution time. 2018-01-08 10:14:54 +01:00
sleep tests-mbed_hal-sleep: decrease delay when testing if us ticker is disabled in deep-sleep mode. 2018-05-25 12:04:32 -05:00
sleep_manager test: add sleep manager tests 2017-09-07 15:35:07 +01:00
sleep_manager_racecondition Skip higher level ticker tests for targets with stale ticker target specific drivers. 2018-05-25 12:17:49 -05:00
ticker Increase ticker test time for slower devices 2017-10-05 11:57:35 -05:00
us_ticker Add tests for ticker HAL API. 2018-05-25 12:04:32 -05:00