Przemyslaw Stekiel 85ce887cea lp_us_tickers test: provide minor fixes after review ... - count_ticks: fix counter overflow handling, - count_ticks: use reg_cycles variable in while loop, - increment test: reduce number of cycles for slow cores if measure process needs to be repeated (difference is greater than 1).		2018-05-25 12:20:10 -05:00
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common_tickers	lp_us_tickers test: provide minor fixes after review	2018-05-25 12:20:10 -05:00
common_tickers_freq	Rename lp_us tests to common and hf to microsecond	2018-05-25 12:20:09 -05:00
critical_section	Reorganize TARGET_MCU_NRF51822_UNIFIED directories	2018-05-08 10:10:01 -07:00
flash/functional_tests	Re-enable flash clock test for NRF52 but with higher tolerance	2018-04-26 09:33:43 -07:00
lp_ticker	Rename DEVICE_LOWPOWERTIMER to DEVICE_LPTICKER	2018-05-25 12:20:09 -05:00
rtc_time	Add tests for extended RTC.	2017-12-05 07:53:41 +01:00
rtc_time_conv	RTC time conversion test - reduce number of tested years in order to reduce test execution time.	2018-01-08 10:14:54 +01:00
sleep	tests-mbed_hal-sleep: decrease delay when testing if us ticker is disabled in deep-sleep mode.	2018-05-25 12:04:32 -05:00
sleep_manager	test: add sleep manager tests	2017-09-07 15:35:07 +01:00
sleep_manager_racecondition	Skip higher level ticker tests for targets with stale ticker target specific drivers.	2018-05-25 12:17:49 -05:00
ticker	Increase ticker test time for slower devices	2017-10-05 11:57:35 -05:00
us_ticker	Add tests for ticker HAL API.	2018-05-25 12:04:32 -05:00