mirror of https://github.com/ARMmbed/mbed-os.git
121 lines
3.3 KiB
C++
121 lines
3.3 KiB
C++
/* mbed Microcontroller Library
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* Copyright (c) 2017 ARM Limited
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*
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* Licensed under the Apache License, Version 2.0 (the "License");
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* you may not use this file except in compliance with the License.
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* You may obtain a copy of the License at
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*
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* http://www.apache.org/licenses/LICENSE-2.0
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*
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* Unless required by applicable law or agreed to in writing, software
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* distributed under the License is distributed on an "AS IS" BASIS,
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* WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
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* See the License for the specific language governing permissions and
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* limitations under the License.
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*/
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#include "mbed.h"
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#include "unity.h"
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#include "utest.h"
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#include "test_env.h"
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#include "atomic_usage.h"
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#include "ExhaustibleBlockDevice.h"
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#include "SlicingBlockDevice.h"
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using namespace utest::v1;
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// test configuration
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#ifndef MBED_TEST_SIM_BLOCKDEVICE
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#error [NOT_SUPPORTED] Simulation block device required for wear leveling tests
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#endif
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#ifndef MBED_TEST_SIM_BLOCKDEVICE_DECL
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#define MBED_TEST_SIM_BLOCKDEVICE_DECL MBED_TEST_SIM_BLOCKDEVICE bd(MBED_TEST_BLOCK_COUNT*512, 1, 1, 512)
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#endif
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#ifndef MBED_TEST_BLOCK_COUNT
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#define MBED_TEST_BLOCK_COUNT 64
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#endif
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#ifndef MBED_TEST_ERASE_CYCLES
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#define MBED_TEST_ERASE_CYCLES 100
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#endif
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#ifndef MBED_TEST_TIMEOUT
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#define MBED_TEST_TIMEOUT 480
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#endif
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// declarations
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#define STRINGIZE(x) STRINGIZE2(x)
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#define STRINGIZE2(x) #x
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#define INCLUDE(x) STRINGIZE(x.h)
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#include INCLUDE(MBED_TEST_SIM_BLOCKDEVICE)
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static uint32_t test_wear_leveling_size(uint32_t block_count)
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{
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MBED_TEST_SIM_BLOCKDEVICE_DECL;
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// bring up to get block size
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bd.init();
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bd_size_t block_size = bd.get_erase_size();
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bd.deinit();
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SlicingBlockDevice slice(&bd, 0, block_count*block_size);
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ExhaustibleBlockDevice ebd(&slice, MBED_TEST_ERASE_CYCLES);
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printf("Testing size %llu bytes (%lux%llu) blocks\n",
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block_count*block_size, block_count, block_size);
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setup_atomic_operations(&ebd, true);
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int64_t cycles = 0;
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while (true) {
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int64_t ret = perform_atomic_operations(&ebd);
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check_atomic_operations(&ebd);
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if (-1 == ret) {
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break;
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}
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cycles++;
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TEST_ASSERT_EQUAL(cycles, ret);
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}
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printf(" Simulated flash lasted %lli cylces\n", cycles);
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return cycles;
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}
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/**
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* Check that storage life is proportional to storage size
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*
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* This test is to ensure that littlefs is properly handling wear
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* leveling. It does this by creating a simulated flash block device
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* which can be worn out and then using it until it is exhausted.
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* It then doubles the size of the block device and runs the same
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* test. If the block device with twice the size lasts at least
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* twice as long then the test passes.
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*/
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void test_wear_leveling()
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{
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uint32_t cycles_1 = test_wear_leveling_size(MBED_TEST_BLOCK_COUNT / 2);
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uint32_t cycles_2 = test_wear_leveling_size(MBED_TEST_BLOCK_COUNT / 1);
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TEST_ASSERT(cycles_2 > cycles_1 * 2);
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}
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Case cases[] = {
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Case("test wear leveling", test_wear_leveling),
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};
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utest::v1::status_t greentea_test_setup(const size_t number_of_cases)
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{
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GREENTEA_SETUP(MBED_TEST_TIMEOUT, "default_auto");
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return greentea_test_setup_handler(number_of_cases);
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}
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Specification specification(greentea_test_setup, cases, greentea_test_teardown_handler);
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int main()
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{
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Harness::run(specification);
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}
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