Steven Cooreman
54de9fa1df
Increase ADC test tolerance to 5%
...
During the SiP workshop, we discovered that 3% is too narrow due to a combination of:
Voltage rail differences between target and FPGA
Extension of lesser-resolution ADC's to 16-bit results
2019-07-25 15:18:27 +01:00
Filip Jagodzinski
a8cdabceee
Test: HAL: serial: Add DEVICE_SERIAL_FC guards
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Fix undefined references to serial_set_flow_control.
2019-07-25 15:18:27 +01:00
jeromecoutant
e42de1f055
FPFA I2C: correct init bloc number
2019-07-25 15:18:27 +01:00
jeromecoutant
eb4b323e2e
FPGA PWM: wait 1 period before measurement
2019-07-25 15:18:27 +01:00
jeromecoutant
333ed3e85a
FPGA SPI: ASYNC issue
2019-07-25 15:18:27 +01:00
Russ Butler
f71baa24be
Remove FPGA analog out test
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Remove the analog out test temporarily due to limitations of the
FPGA rev 2 hardware.
2019-07-11 11:41:30 +01:00
Przemyslaw Stekiel
05ff391030
FPGA SPI test: Fix typo
2019-07-11 11:41:30 +01:00
Przemyslaw Stekiel
c4f9a8d566
FPGA SPI test: Fix unsupported transfer case
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Co-Authored-By: Filip Jagodziński <fkjagodzinski@gmail.com>
2019-07-11 11:41:30 +01:00
Przemyslaw Stekiel
37dcf826c3
Extend FPGA SPI test
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Add test cases for:
- async mode,
- different frequencies,
- block write
2019-07-11 11:41:30 +01:00
Russ Butler
b0de32c07c
FPGA test shield: Allow any defined form factor
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Build in the FPGA tests if either MBED_CONF_TARGET_DEFAULT_FORM_FACTOR
or TARGET_FF_ARDUINO is defined.
2019-07-11 11:41:30 +01:00
Filip Jagodzinski
5a007262b4
FPGA test shield: Restrict tests to Arduino FF only
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Currently only the Arduino form factor is supported. Support for other
form factors will be added in the future.
2019-07-11 11:41:30 +01:00
Russ Butler
6902844cf2
Skip form factor pins marked as NC
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The gpio and gpio_irq FPGA tests run on form factor pins that are
marked as NC. This patch changes that behavior so they skip NC
pins.
2019-07-11 11:41:30 +01:00
Przemyslaw Stekiel
306ecbe9cc
FPGA uart test: Remove unsupported test cases
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Not all uart features are supported by specific platforms.
2019-07-11 11:40:55 +01:00
Przemyslaw Stekiel
a887855250
FPGA Analogin test: Remove test case which can not be executed
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The test case which checks full range cannot be executed at the moment due to a hardware bug in FPGA-Test-Shield.
This test case will be restored when the final version of FPGA-Test-Shield is ready.
2019-07-11 11:40:55 +01:00
Przemyslaw Stekiel
cd1321d59f
FPGA Analogout test: mark dead code as debug code, increase tolerance
2019-07-11 11:40:54 +01:00
Przemyslaw Stekiel
dff4f3b536
FPGA Analogin test: Remove usage of FULL_TEST_SHIELD symbol, increase tolerance
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Keep "AnalogIn - full test" disabled due to hardware issue in the first rev of FPGA Test Shield.
2019-07-11 11:40:54 +01:00
Przemyslaw Stekiel
2f90312547
FPGA I2C test update.
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Divide one test case to four test cases to increase readability.
Adapted to the last version of the FPGA CI Test Shield API.
2019-07-11 11:40:54 +01:00
Przemyslaw Stekiel
7ae579b890
Bring FPGA-Test-Shield tests into Mbed-os master.
2019-07-11 11:40:54 +01:00