Commit Graph

95 Commits (e1fc81dc4195413424e4007af72a43471d11b51e)

Author SHA1 Message Date
Bartek Szatkowski b9814fae9b Fix missmatch between feature branches and new CMSIS 2018-05-25 13:04:23 -05:00
Przemyslaw Stekiel c437e9d2c6 tests-mbed_hal-rtc_reset: Add ack from the device after each command is executed
RTC reset test was failing when board has been just powered and RTC reset test was executed for the first time (issue has been detected on CI). In such case RTC initialization takes more time than in futher rtc_init calls. This has impact on green-tea communication. Commands send by host immediately after init command (write, read) were not handled on the device side and no response to the host was provided.
To fix this problem test communication flow has been modified. Device sends ack to the host after RTC init is done. Host sends further RTC commands when ack from the device has been received.

Edit:
There are still some communication issues on the CI. Add ack from the device after each executed command. Increase test timeout and wait after reset.
2018-05-25 12:52:02 -05:00
Przemyslaw Stekiel a1d92e5168 HAL rtc test: increase test timeout.
Verified that on some platforms 30s is not enough.
2018-05-25 12:49:48 -05:00
Przemyslaw Stekiel 105b0ab851 HAL rtc test: check only if rtc_isenabled() returns 1 in case when init is done.
Since some platforms use RTC for low power timer RTC may be already enabled.
Because of that we will only verify if rtc_isenabled() returns 1 in case when init is done and RTC time is set.
2018-05-25 12:49:48 -05:00
Przemyslaw Stekiel a0f1627316 Update of RTC HAL API tests.
Provide minor fixes for existing test cases.
Add additional test cases.
2018-05-25 12:49:11 -05:00
Russ Butler 1f97f11373 Add documentation and test the HAL RTC API
Add requirements, tests, an example implementation and additional
function documentation to the HAL RTC API.
2018-05-25 12:37:19 -05:00
Przemyslaw Stekiel e7fa5fc599 tests-mbed_hal-flash: optimieze time_cpu_cycles() function
This function should perform instruction cycles count in critical section.
Additionally remove redundant code.
2018-05-25 12:33:42 -05:00
Przemyslaw Stekiel be098399a8 tests-mbed_hal-flash: Remove 5% extra tolerance for NRF52_DK
NRF52_DK is now based on fast and accurate 1MHz counter.
2018-05-25 12:33:42 -05:00
Przemyslaw Stekiel 50a5e2c1f4 tests-mbed_hal-common_tickers: fix bug in ticker increment test case
It is possible that the difference between base and next tick count on some platforms is greater than 1, in this case we need to repeat counting with the reduced number of cycles (for slower boards).
If number of cycles has been reduced than base tick count needs to be redefined. This operation is missing and is added by this patch.
2018-05-25 12:33:42 -05:00
Bartek Szatkowski 95559ad3e1 Change LPTICKER spec to allow clock freq starting at 4kHz 2018-05-25 12:32:39 -05:00
Przemyslaw Stekiel c18763bb41 tests-mbed_hal-common_tickers: disable os tick while running test cases
It has been noticed on NRF51_DK board that occurrence of system tick have impact on test execution.
NRF51_DK is a slow board with fast us ticker and handling of system tick interrupt takes about 250 us ticker ticks which have huge influence on interrupt tests where interrupt is set to <current count> + 100, 200, 500 ticks.
2018-05-25 12:30:52 -05:00
Przemyslaw Stekiel ff39a9874a tests-mbed_hal-common_tickers: increase overflow protection limit
For NR51_DK US_TICKER_OV_LIMIT needs to be increased since if test is run few times in row sometimes fails. This is because NR51_DK is a slow board (16 MHz) with fast and short us ticker counter 1 MHz/16 bits.
2018-05-25 12:29:55 -05:00
Przemyslaw Stekiel 8979212b78 tests-mbed_hal-lp_ticker: run sleep test only if SLEEP support is enabled. 2018-05-25 12:29:54 -05:00
jeromecoutant 26313d8938 tests-mbed_hal-common_tickers_freq : correct overflowCounter value 2018-05-25 12:22:06 -05:00
jeromecoutant d2fff9cab3 tests-mbed_hal-common_tickers_freq : use unsigned long 2018-05-25 12:22:06 -05:00
Przemyslaw Stekiel ea61f9887e tests-mbed_hal-lp_ticker: Add overflow protection. 2018-05-25 12:21:16 -05:00
Russ Butler 9c2d758cda Restore ticker state after each test
Update the ticker common test to clean up after each case by restoring
the ticker IRQ handler. This allows tickers to function normally after
each case has completed.
2018-05-25 12:21:16 -05:00
jeromecoutant 69b51dffaf tests-mbed_hal-lp_ticker : increase time before deep sleep 2018-05-25 12:21:16 -05:00
Przemyslaw Stekiel 85ce887cea lp_us_tickers test: provide minor fixes after review
- count_ticks: fix counter overflow handling,
- count_ticks: use reg_cycles variable in while loop,
- increment test: reduce number of cycles for slow cores if measure process needs to be repeated (difference is greater than 1).
2018-05-25 12:20:10 -05:00
Przemyslaw Stekiel f6163a341c lp_us_tickers test: call overflow_protect function in test functions instead test setup handler.
This is done to bypass green-tea setup handler which takes additional time.
2018-05-25 12:20:10 -05:00
Przemyslaw Stekiel 8f52816bba lp_us_tickers test: fix overflow protection
On slow targets with fast high frequency tickers like NRF51_DK (16 Mhz CPU/1MHz ticker) time window for test case execution without overflow needs to be increased. Add parameter to `overflow_protect` function to be able to set different time window without overflow for us ticker and lp ticker.
2018-05-25 12:20:10 -05:00
Przemyslaw Stekiel 0ecf58f51c lp_us_tickers test: fix `increment test` for slow boards
Increment test proves that ticker counter is incremented by one.
This is done indirectly for high frequency counters where it is impossible to read 'value' and 'value + 1' in two successive ticker reads.
This check is done indirectly by counting ticker ticks elapsed during execution of N cycles of empty while loop. Unfortunately on slow boards with fast tickers like NRF51_DK(16 MHz CPU/1MHz hf ticker) it is possible that for the same N cycles measured number of elapsed ticks in two successive calls is greater than 1. This patch provides fix for such case - measure operation is repeated with the same number of cycles.
2018-05-25 12:20:10 -05:00
Bartek Szatkowski ba963b4453 Rename lp_us tests to common and hf to microsecond 2018-05-25 12:20:09 -05:00
Bartek Szatkowski 6e9f04bf2f Rename DEVICE_LOWPOWERTIMER to DEVICE_LPTICKER
That's to match DEVICE_USTICKER.
2018-05-25 12:20:09 -05:00
Przemyslaw Stekiel f55f9d36fb lp_ticker test - provide lp ticker glitch test case
Test that lp ticker does not glitch backwards due to an incorrectly implemented ripple counter driver.
2018-05-25 12:18:55 -05:00
Przemyslaw Stekiel 6d7aef6bf1 lp_us_tickers test - fix count_ticks() function to give the same results on all compilers
count_ticks() function counts ticker ticks elapsed during execution of N cycles of empty while loop.
In current version N value (cycles) is given as volatile paramater in order to disable possible compiler optimalisation.
There was a problem with measured time on different compilers and additionally results on ARM compiler were unexpected (the difference beetween measured elapsed ticks for the same number of cycles was to large). This might be caused by the memory access in order to store updated variable in memory. To fix this issue given numer of cycles has been stored into register and register is decremented (no memory access).

With this fix count_ticks(NUM_OF_CYCLES, 1) call returns 2500 +/-1 for us ticker ticks using each compiler (K64F).
2018-05-25 12:18:55 -05:00
Przemyslaw Stekiel c4cf1f1eae lp_us_tickers test - add tolerance to interrupt time.
On some platforms (e.g. K64F) different counters are used for time measurement and interrupt generation.
Because of that we should relax interrupt test case and give additional time before checking if interrupt handler has been executed.
2018-05-25 12:18:55 -05:00
Przemyslaw Stekiel e0fcce592c lp_us_tickers test - provide counter overflow protection
Since according to the ticker requirements min acceptable counter size is 12 bits (low power timer) for which max count is 4095, then all test cases must be executed in this time window.
HAL ticker layer handles overflow and it is not handled in the target ticker drivers.
2018-05-25 12:18:55 -05:00
Przemyslaw Stekiel 9d84143276 Provide fix to the implementation of ticker_overflow_test test case.
The intention was to use ticker_overflow_delta equal to 0 for low power ticker tests and ticker_overflow_delta equal to 50 for high frequency ticker tests. Current implementation is invalid since for devices which provide LOW_POWER_TIMER feature delta is equal to 0 and for devices without this feature delta is equal 50.
2018-05-25 12:17:49 -05:00
Przemyslaw Stekiel 1bd2e517a0 Modify ticker_init_test() to be consistent with the new requirement. 2018-05-25 12:17:49 -05:00
Przemyslaw Stekiel 7227670416 Skip higher level ticker tests for targets with stale ticker target specific drivers.
Since target specific ticker drivers are not ready also features which uses ticker in upper layers may not work correctly and tests for these features.
We need to disable also failing higher level ticker related tests (by adding check if DEVICE_USTICKER symbol is available and raise #error [NOT_SUPPORTED] if not).
2018-05-25 12:17:49 -05:00
Przemyslaw Stekiel c32ccf69b1 Add tests for ticker HAL API. 2018-05-25 12:04:32 -05:00
Russ Butler 03d7141797 Add documentation for the HAL Ticker API
Add documentation and test header for the HAL Ticker API.
2018-05-25 12:04:32 -05:00
Przemyslaw Stekiel f226ae2fc9 tests-mbed_hal-sleep: decrease delay when testing if us ticker is disabled in deep-sleep mode.
This is done because of possible limitations of lowpower ticker freq/width.
2018-05-25 12:04:32 -05:00
Przemyslaw Stekiel 996374e4dc tests-mbed_hal-sleep: fix formatting. 2018-05-25 12:04:32 -05:00
Przemyslaw Stekiel 7f56bb0c23 tests-mbed_hal-sleep: remove unused variable. 2018-05-25 12:04:32 -05:00
Przemyslaw Stekiel 20a9da5b73 tests-mbed_hal-sleep: use lp ticker data while testing deepsleep. 2018-05-25 12:04:32 -05:00
Przemyslaw Stekiel 160c75d099 tests-mbed_hal-sleep: add lp/us ticker overflow handling. 2018-05-25 12:04:32 -05:00
Przemyslaw Stekiel b2d3338ad7 Add test and test header to Sleep HAL API. 2018-05-25 12:03:37 -05:00
Marcus Chang 1aebdcbee5 Reorganize TARGET_MCU_NRF51822_UNIFIED directories
The unified NRF51 target and feature BLE directories have been
reorganized to follow the naming and directory structure of the
NRF52 implementation.

This reorganization does not include TARGET_MCU_NRF51822 and
derived targets.
2018-05-08 10:10:01 -07:00
Marcus Chang 5910cd7546 Re-enable flash clock test for NRF52 but with higher tolerance
The flash clock test is disabled for the NRF52 series. This change
re-enables the test but with a higher tolerance to accommodate the
high jitter on the current ticker implementation.
2018-04-26 09:33:43 -07:00
Marcus Chang 60397c527e Renamed NRF52 targets for HAL critical section test 2018-04-19 09:40:41 -07:00
Cruz Monrreal II 9f6301333b Disabled flash clock and cache test for NRF52 MCUs.
This is meant to be a temporary fix until the issue has been root caused, and Jenkins CI is no longer intermittently failing.
2018-03-19 11:13:22 -05:00
Shrikant Tudavekar efe4600cee measure the time over a longer range 2018-02-26 18:03:08 -06:00
Maciej Bocianski 5aaad0850c sleep_manager_racecondition: fix for slow devices
sleep_manager_racecondition test fix for devices with low CPU clock

This RP contains fix for sleep_manager_racecondition test
for very slow devices (like NRF51). It fixes the test itself
as well as side effects of fix introduced in
 #5046 (us ticker: fix fire interrupt handling)

The idea of the test was to test race condition between main thread
and interrupt handler calling the same function.
To efficiently test this, each handler call should interrupt
main thread to make race more likely.
On very slow devices (like NRF51) when we set very low ticker period
(e.g less then 1000us for NRF51) there is no much time for thread scheduling.
On such slow devices, setting period to 500 us cause that
main thread is scheduled very rarely and only handler is
constantly called making test unreliable.
Fix introduced in #5046 (us ticker: fix fire interrupt handling)
changed fire_interrupt function implementation causing more
interrupt tailing thus even less time for main thread scheduling.
After introduction of #5046 (us ticker: fix fire interrupt handling)
when running sleep_manager_racecondition test on NRF51
(with ticker1.attach_us(&sleep_manager_locking_irq_test, 500);)
test is failing with timeout due to the fact that interrupt
handler is constantly called and main thread is never scheduled.
2018-02-22 11:36:08 +01:00
Maciej Bocianski 628f521919 Add tests for critical section HAL API 2018-01-24 10:14:06 +01:00
Cruz Monrreal 45d7f505a8
Merge pull request #5831 from marcuschangarm/test-hal-flash-fix
Increase clock tolerance in Flash HAL test
2018-01-12 10:05:01 -06:00
Marcus Chang d60bed2da9 Increase clock tolerance in Flash HAL test
The current 0.1% clock tolerance is too small for certain platforms
which natural variance is larger than this. This commit increases the
tolerance to 0.5% instead.

Sample output from time_cpu_cycles called repeatedly in init,
before running any flash tests:

[1515706585.63][CONN][RXD] diff: 49316
[1515706585.69][CONN][RXD] diff: 49256
[1515706585.75][CONN][RXD] diff: 49286
[1515706585.81][CONN][RXD] diff: 49256
[1515706585.87][CONN][RXD] diff: 49225
[1515706585.94][CONN][RXD] diff: 49286
[1515706585.99][CONN][RXD] diff: 49317
[1515706586.06][CONN][RXD] diff: 49255
[1515706586.12][CONN][RXD] diff: 49286
[1515706586.18][CONN][RXD] diff: 49285
[1515706586.24][CONN][RXD] diff: 49286
[1515706586.31][CONN][RXD] diff: 49347
[1515706586.36][CONN][RXD] diff: 49347
[1515706586.43][CONN][RXD] diff: 49286
[1515706586.49][CONN][RXD] diff: 49286
[1515706586.55][CONN][RXD] diff: 49256
[1515706586.61][CONN][RXD] diff: 49286
[1515706586.68][CONN][RXD] diff: 49346
[1515706586.74][CONN][RXD] diff: 49347
[1515706586.80][CONN][RXD] diff: 49256

Notice the outliers will cause intermittent CI failures.
2018-01-11 13:44:51 -08:00
Przemyslaw Stekiel e725b4c2c5 RTC time conversion test - reduce number of tested years in order to reduce test execution time.
For each of the following years test example time of the first and last day of each month:
- first - 1970
- example not leap year (not divisible by 4)
- example leap year (divisible by 4 and by 100 and by 400)
- example leap year (divisible by 4 and not by 100)
- example not leap year (divisible by 4 and by 100)
- last fully supported  - 2105

Test execution time on K64F is now ~39 sec.
2018-01-08 10:14:54 +01:00
Przemyslaw Stekiel fcdaeccea1 Add tests for extended RTC. 2017-12-05 07:53:41 +01:00