All tests will run for each storage component available on device excapt for test_get_type_functionality that will run once on the default blockdevice.
Don't allocate the sector map array in this function,
as it was buggy and redundant. Separate user config vs. automatic allocation
cases instead (which was essentially the case anyway).
In addition, fix tests to get over failures in low end boards
Set tasklet parameters before connecting to prevent the parameters to be set to 0.
The tasklet parameters are reset to 0 when wisun_tasklet_connect gets called,
thus those need to be set in the wisun_tasklet_configure_and_connect_to_network
before they are used. This is also done this way in other tasklets.
Socket network interface tests were failing due to DICONNECTED event
being advertised, where GLOBAL_UP was expected. It turned out that
nanostack receives two events: APPL_EVENT_CONNECT and
APPL_BACKHAUL_INTERFACE_PHY_UP. The second attempt to connect obviously
returns errors, but it also causes events to be sent out to the
application. The second attempt should not take place in case the
bootstrap is already started.
I also fixed two reports being sent with DISCONNECT status, while they
are actually something else.
The relationnal operators were targeting the base class which defines an implicit constructor to an integral value. This is wrong as it allows SafeEnum instances to be compared against integers.
The fix is simple: define relationnal operators for the derived class. The derived class is known as it is passed as a template parameter of the base class.
For extra safety the SafeEnum constructor is now explicit and protected.