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137 Commits (c73b091a6e275d3b142b08dc40dec547d80499cf)

Author SHA1 Message Date
Przemek Wirkus d9fbefd373 Test compliance with LPC1549 and LPC11U68 2014-07-30 17:53:01 +01:00
Przemek Wirkus 12c7ba5ee2 Small refactoring for SD card tests for TARGET_K64F platform 2014-07-28 13:35:10 +01:00
Przemek Wirkus cd05521867 Added simple random seed provider. 2014-07-28 09:20:46 +01:00
Przemek Wirkus 2415d391d7 Added pseudo random seed source from compiler -D option 2014-07-24 15:33:49 +01:00
Mihail Stoyanov 8d5d92fea8 Added notify_start() to indicate test start 
Added BusOut test
 2014-07-22 09:53:05 +03:00
Przemek Wirkus 1da17bd076 Added MMA8451Q accelerometer test port for K20D50M platform 2014-07-15 12:32:10 +01:00
Przemek Wirkus da68637753 Removed compilation warning about unused variable in i2c test 2014-07-15 12:08:35 +01:00
Przemek Wirkus ac667d6a3e Added SD card and EEPROM test pins for new Freescale K20D50M platform 2014-07-15 10:13:20 +01:00
Przemek Wirkus 0ca9a48b63 Indented using AStyle 2014-07-10 10:57:44 +01:00
Mihail Stoyanov 2018e40f3c Change LED blinking rate when tests finish 2014-07-04 20:32:14 +03:00
Mihail Stoyanov ac85b9f6a0 Added mbed blinky to tests 2014-07-04 20:10:28 +03:00
bcostm 693035b74f Add NUCLEOs targets in TMP102 test 2014-07-04 10:00:13 +02:00
Przemek Wirkus c97f1b8139 Added support for cpputest library. UT libray now compiles as separate lib, just like other libs. For example ETH or RTX. Added support for cpputest sources in root of mbed project (on the same level with mbed sdk repo). changes include adding new paths to the project. Two example UT (UT_1, UT_2 are added). New option -O is introduced to force 'test build only' 2014-07-01 17:45:38 +01:00
Przemek Wirkus 02ef2410cf Changed default p5 pin for DigitalOut to LED1 pin - so it is available on all devices supporting this test 2014-07-01 13:22:41 +01:00
Toyomasa Watarai b1cae3da93 [LPC1549] Added CAN support 
Added CAN API support for LPC1549 target.
Tested with LPC1768 target using NXP TJA1042 CAN transceiver.
 2014-06-30 15:21:42 +09:00
Christian Taedcke 021074eb1f [LPC1549] Enable analog test. 2014-06-23 19:17:38 +02:00
Christian Taedcke d27129351c [LPC1549] Fix pin assignment for simple io tests. 2014-06-23 19:17:38 +02:00
Przemek Wirkus a7d1228723 Added new NUCLEO boards definitions to general tests 2014-06-23 15:56:47 +01:00
0xc0170 971038f2ed spaces removal - tests 2014-05-29 15:50:20 +02:00
ban4jp 49cdbbfe5d [KLXX] Added RPC + RTOS support 2014-05-25 18:03:50 +09:00
Przemek Wirkus 7afde21d4d Added pins for EEPROM line test 2014-05-20 15:24:21 +01:00
Przemek Wirkus 20d2618d19 SD card test updated with 11U68 pinology 2014-05-20 15:05:28 +01:00
Przemek Wirkus 30424b260d Code indentation only 2014-05-16 14:33:10 +01:00
Przemek Wirkus d6168f30cf Added TARGET_LPC11U68 to timer/ticker/eeprom tests 2014-05-16 14:29:51 +01:00
Przemek Wirkus 55c4d96efc Added NUCLEO L053R8 to SD test definitions 2014-05-16 11:16:47 +01:00
Przemek Wirkus ef1f4756c1 Removed compilation error 2014-05-14 17:21:11 +01:00
Przemek Wirkus 63d2bba43c Add new ST target TARGET_NUCLEO_L053R8 to few tests 2014-05-14 14:54:11 +01:00
Mihail Stoyanov 7882b9ca20 Merge branch 'master' of https://github.com/mbedmicro/mbed 2014-05-05 13:57:45 +03:00
Przemek Wirkus 044b5131cb Added NUCLEO_F103RB, NUCLEO_L152RE, NUCLEO_F302R8, NUCLEO_F030R8, NUCLEO_F401RE defines to timer tests. Fixed bug related to Nucleo not responding to singletest.py test execution 2014-05-02 19:54:40 +01:00
Mihail Stoyanov bdb8464262 Merge branch 'master' of https://github.com/mbedmicro/mbed 2014-05-02 15:12:47 +03:00
Przemek Wirkus e5b475f654 Added TARGET_NUCLEO_L152RE define to Timeout test 2014-04-30 13:57:14 +01:00
Przemek Wirkus 96f78f4151 Added TARGET_NUCLEO_L152RE define to Timer us test 2014-04-30 13:57:13 +01:00
Przemek Wirkus 70956ff794 Added TARGET_NUCLEO_L152RE define to Ticker 2 test 2014-04-30 13:57:12 +01:00
Przemek Wirkus 935ce7c733 Added TARGET_NUCLEO_L152RE define to EEPROM test 2014-04-30 13:57:11 +01:00
Przemek Wirkus d0b7f3009d Updated test MBED_A4 (i2c_TMP102) with LPC2368 target 2014-04-30 13:57:09 +01:00
Przemek Wirkus 23b696133a Added LPC2368 to SD card and TMP102 tests 2014-04-30 13:57:07 +01:00
Przemek Wirkus 5eb40d38ca Small refactoring + code indent 2014-04-24 14:41:53 +01:00
Przemek Wirkus 4927a9d7e3 Small updates for test MBED_A12, MBED_A19, MBED_A25 (SD, EEPROM, EEPROM) 2014-04-24 13:48:39 +01:00
Przemek Wirkus 77c96631cc Updated MBED_A19 24LC256 EEPROM test. Added new test MBED_A25 24LC256 I2C EEPROM pattern write/read to test suite 2014-04-24 13:48:38 +01:00
Przemek Wirkus 6b044ada5b Added KL25Z_5 MMA8451Q accelerometer test to test automation suite 2014-04-16 11:49:35 +01:00
dinau 9617a966df Merge branch 'mbedmicro.org/master' 2014-04-12 00:40:38 +09:00
Mihail Stoyanov ead2bc63cb Merge branch 'master' of https://github.com/mbedmicro/mbed 2014-04-09 15:14:46 +01:00
Przemek Wirkus 602a4ed8eb Added EXAMPLE_1 /dev/null redirection host test to automation suite 2014-04-09 11:32:44 +01:00
dinau d9c2175a05 [STM32F3-Discovery][DISCO_F303VC] initial port. 2014-04-08 22:30:24 +09:00
Przemek Wirkus 5804ee610b Added MBED_26 Integer constant division test to test suite 2014-04-08 12:09:22 +01:00
Przemek Wirkus 38f84aa194 Added MBED_22 Semihost test automation to test suite 2014-04-08 11:24:58 +01:00
Przemek Wirkus 528b3136d3 MBED_10 Hello World test host automation added to test suite 2014-04-08 10:20:44 +01:00
Mihail Stoyanov 3633348676 Changed the Arduino tests order 2014-04-07 16:56:13 +01:00
Bogdan Marinescu 2e32c71b50 [K64F] Ensure immediate update of CnV register in FTM 
Also changed pin assignment for the PWM test.
 2014-04-07 16:48:56 +01:00
Bogdan Marinescu 286a4e42f6 [K64F] Fix PWM implementation 
Also change the pin for the PWM LED test.
 2014-04-07 16:29:54 +01:00