Commit Graph

6 Commits (b81aeff1a3e171c6421984faa2cc18d0e35746c0)

Author SHA1 Message Date
Steven Cooreman 54de9fa1df Increase ADC test tolerance to 5%
During the SiP workshop, we discovered that 3% is too narrow due to a combination of:
Voltage rail differences between target and FPGA
Extension of lesser-resolution ADC's to 16-bit results
2019-07-25 15:18:27 +01:00
Russ Butler b0de32c07c FPGA test shield: Allow any defined form factor
Build in the FPGA tests if either MBED_CONF_TARGET_DEFAULT_FORM_FACTOR
or TARGET_FF_ARDUINO is defined.
2019-07-11 11:41:30 +01:00
Filip Jagodzinski 5a007262b4 FPGA test shield: Restrict tests to Arduino FF only
Currently only the Arduino form factor is supported. Support for other
form factors will be added in the future.
2019-07-11 11:41:30 +01:00
Przemyslaw Stekiel a887855250 FPGA Analogin test: Remove test case which can not be executed
The test case which checks full range cannot be executed at the moment due to a hardware bug in FPGA-Test-Shield.
This test case will be restored when the final version of FPGA-Test-Shield is ready.
2019-07-11 11:40:55 +01:00
Przemyslaw Stekiel dff4f3b536 FPGA Analogin test: Remove usage of FULL_TEST_SHIELD symbol, increase tolerance
Keep "AnalogIn - full test" disabled due to hardware issue in the first rev of FPGA Test Shield.
2019-07-11 11:40:54 +01:00
Przemyslaw Stekiel 7ae579b890 Bring FPGA-Test-Shield tests into Mbed-os master. 2019-07-11 11:40:54 +01:00