12 Commits (a4bf0cf135adcccc7dd69cd2bc7908e7baaa2be8)

Author	SHA1	Message	Date
bcostm	e0e18f54d6	[NUCLEO_F070RB] Update tests with this target	2015-01-09 11:21:15 +01:00
Przemek Wirkus	3ec2247713	K22F: added peripheral pin definitions to SD card tests and I2C EEPROM tests	2015-01-08 14:06:39 +00:00
bcostm	c4bac8eb8a	Tests: re-order and add new NUCLEO targets	2014-09-23 13:01:21 +02:00
Przemek Wirkus	12c7ba5ee2	Small refactoring for SD card tests for TARGET_K64F platform	2014-07-28 13:35:10 +01:00
Przemek Wirkus	da68637753	Removed compilation warning about unused variable in i2c test	2014-07-15 12:08:35 +01:00
Przemek Wirkus	ac667d6a3e	Added SD card and EEPROM test pins for new Freescale K20D50M platform	2014-07-15 10:13:20 +01:00
Przemek Wirkus	a7d1228723	Added new NUCLEO boards definitions to general tests	2014-06-23 15:56:47 +01:00
Przemek Wirkus	7afde21d4d	Added pins for EEPROM line test	2014-05-20 15:24:21 +01:00
Przemek Wirkus	63d2bba43c	Add new ST target TARGET_NUCLEO_L053R8 to few tests	2014-05-14 14:54:11 +01:00
Przemek Wirkus	044b5131cb	Added NUCLEO_F103RB, NUCLEO_L152RE, NUCLEO_F302R8, NUCLEO_F030R8, NUCLEO_F401RE defines to timer tests. Fixed bug related to Nucleo not responding to singletest.py test execution	2014-05-02 19:54:40 +01:00
Przemek Wirkus	4927a9d7e3	Small updates for test MBED_A12, MBED_A19, MBED_A25 (SD, EEPROM, EEPROM)	2014-04-24 13:48:39 +01:00
Przemek Wirkus	77c96631cc	Updated MBED_A19 24LC256 EEPROM test. Added new test MBED_A25 24LC256 I2C EEPROM pattern write/read to test suite	2014-04-24 13:48:38 +01:00