3 Commits (a089661f054f3e238208f0f28b22af172cac3421)

Author	SHA1	Message	Date
Maciej Bocianski	c836b79e37	qspi_hal_test - remove unused variables	2018-08-30 07:39:41 +02:00
Maciej Bocianski	b41ce6c090	qspi_hal_test - randomize flash RW addres ... randomize flash address during test to extend flash life	2018-08-29 17:10:29 +02:00
Maciej Bocianski	db8cee04fc	qspi_hal_test refactoring ... - code refactoring and preparation for enabling DPI/QPI tests - reduced multiple test count to 4 - use common flash config header for all MX25RXX35F chips - fix sector erase max time on N25Q128A	2018-08-29 09:32:50 +02:00