12 Commits (765aeb0dc6c67c798358ca4c5b465d1f7f1ef6c4)

Author	SHA1	Message	Date
Mahadevan Mahesh	0ad9220fb1	Add support for FRDM K66 ... Signed-off-by: Mahadevan Mahesh <Mahesh.Mahadevan@nxp.com>	2016-08-15 15:37:25 -05:00
Rafal Fabich	63574f4c48	Added build target for STM32F410RB. ... Initial version that can be built is based on STM32F411RE target which is compatible with F410. TODOs: MCU specific modifications in CMSIS/HAL like memory sizes/map, peripherals, clocks, etc.	2015-11-12 09:07:47 +01:00
bsilvereagle	ec8ac75e88	Replaced SPI pin definitions for K64F in SD tests ... The old pin definitions were all for Port D pins, which are incorrect. These improper pin mappings caused all tests to fail. Pin definitions were replaced with the definitions as stated here - http://developer.mbed.org/media/uploads/sam_grove/xk64f_sensors.jpg.pagespeed.ic.RCpM8talCK.webp Tests now pass on the K64F Sch Rev D1	2015-04-15 09:11:39 -04:00
bcostm	5af36d1e3b	[NUCLEO_L073RZ] Add target in test files	2015-03-16 14:44:36 +01:00
Przemek Wirkus	09c48e4081	Refactored names for MBED_HOSTTEST macros used in test case auto-detection	2015-02-11 10:37:03 +00:00
Przemek Wirkus	a4bf0cf135	Refactored tests for SD card peripheral	2015-01-27 13:44:30 +00:00
nitin.bhaskar.27.09@gmail.com	19fd60321b	On-Board SD Card support added, SD Card related test cases updated too	2015-01-24 22:57:01 +05:30
bcostm	e0e18f54d6	[NUCLEO_F070RB] Update tests with this target	2015-01-09 11:21:15 +01:00
Przemek Wirkus	3ec2247713	K22F: added peripheral pin definitions to SD card tests and I2C EEPROM tests	2015-01-08 14:06:39 +00:00
bcostm	c4bac8eb8a	Tests: re-order and add new NUCLEO targets	2014-09-23 13:01:21 +02:00
Przemek Wirkus	400e4f8085	Added measurement prints to PERF test group	2014-09-01 08:44:08 +01:00
Przemek Wirkus	b9c75a7712	Added 3 new performance tests (PERF_* group). Tests measure read/write speed of file system operation while using Stdio, FatFS and mbed (FIleHandle) implementations	2014-09-01 08:43:52 +01:00