The test failed because it was not possible to switch off an already
active edge detection.
The reason was the GPIO HAL module driver function HAL_GPIO_Init. The
function changes only interrupt or event flags when the EXTI_MODE flag
in GPIO_Init->Mode is set. gpio_irq_set changed the event mode to
EDGE_NONE in gpio_irq_t structure but that doesn't changed the interrupt
and event flags in the CMSIS function because of the missing EXTI_MODE.
Now gpio_irq_set is able to switch off a specific or both edge
detections.
The MBED_A7 test was extended by another test to check if switch off
edge detection is OK.
This commit fixes a number of issues with invalid/wrong pin assignments for the
KL25Z mbed target:
- analog: PTC1 doesn't seem to be exported at all, replaced with PTC2.
- digitalin/out, interruptin, portin/out: these tests used PTA1 and PTA2, which
are the console UART pins for the KL25Z mbed. The tests now use PTA4<->PTC5 and
PTA5<->PTC6.