4 Commits (28a5906479c6d486fc5f42ad27883f0ceedc1e76)

Author	SHA1	Message	Date
Maciej Bocianski	b41ce6c090	qspi_hal_test - randomize flash RW addres ... randomize flash address during test to extend flash life	2018-08-29 17:10:29 +02:00
Maciej Bocianski	82c81900bf	qspi_hal_test add DPI and QPI support	2018-08-29 17:10:00 +02:00
Maciej Bocianski	db8cee04fc	qspi_hal_test refactoring ... - code refactoring and preparation for enabling DPI/QPI tests - reduced multiple test count to 4 - use common flash config header for all MX25RXX35F chips - fix sector erase max time on N25Q128A	2018-08-29 09:32:50 +02:00
Maciej Bocianski	e6923342ef	hal-qspi test: add F413ZH support	2018-08-22 15:02:12 +02:00