Commit Graph

1 Commits (1c0318ccfe0dd18cba452577522eb5b6f526ea97)

Author SHA1 Message Date
Christopher Haster 47684d89a5 Added test config for simulated block devices
Not all devices have enough heap to fit a simulated heap block device,
however using a simulated heap block device is preferred if available
(reduced flash wear, faster testing).

Added MBED_TEST_SIM_BLOCKDEVICE for tests that only need a simulated
block device (wear_leveling + resilience), and added support for targets
that are known to have enough heap.
2017-11-27 19:48:56 -06:00