5 Commits (tools-release-test)

Author	SHA1	Message	Date
Martin Kojtal	6e64fe3800	test: fix SPDX identifier	2020-02-21 07:00:59 +00:00
Maciej Bocianski	d54186601b	hal qspi test: adjust min frequency for EFM32GG11 ... according to the driver limitations	2019-10-04 11:12:58 +02:00
Maciej Bocianski	cffd581308	qspi_hal_test - adjust used memory sector count ... set flash sector count to 1024 for EFM32GG11_STK3701(MX25R3235F) set flash sector count to 2048 for NRF52840_DK(MX25R6435F)	2018-08-31 11:27:42 +02:00
Maciej Bocianski	db8cee04fc	qspi_hal_test refactoring ... - code refactoring and preparation for enabling DPI/QPI tests - reduced multiple test count to 4 - use common flash config header for all MX25RXX35F chips - fix sector erase max time on N25Q128A	2018-08-29 09:32:50 +02:00
Steven	845a5beb30	Initial commit of Silicon Labs QSPI HAL implementation ... * For EFM32GG11, since that is the only Silicon Labs target with QSPI per today * Verified working using the on-board flash and tests-mbed_hal-qspi	2018-08-27 10:03:08 +02:00