Commit Graph

5 Commits (mbed-os-5.6)

Author SHA1 Message Date
jeromecoutant 63ccfa0958 STM32F1 : internal ADC channels 2017-08-09 11:01:19 +02:00
bcostm 8568b40887 F103 devices: Set CAN_RD pins in Input mode instead of A/F Push-Pull
Now MBED_A27/A28 tests are OK again.
Problem seen also by @mgiaco and discussed in PR 2988.
2017-02-20 11:19:53 +01:00
bcostm 354ffe84ab Add channel 17 for Vref 2016-10-05 11:12:47 +02:00
bcostm bcd8f2431a STM32F1xx - Add ADC internal channel (Temperature) 2016-10-05 10:06:15 +02:00
Christopher Haster 0bad622a16 restructure - Moved targets out to top level
hal/targets -> targets
hal/targets.json -> targets/targets.json
2016-09-30 19:18:09 -05:00