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Remove internal test functions

pull/4497/head
Steven Cooreman 2017-04-06 10:02:46 +02:00 committed by Russ Butler
parent 94450374e7
commit 97ef051eba
2 changed files with 0 additions and 128 deletions
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107
targets/TARGET_Silicon_Labs/TARGET_EFM32/trng/sl_trng.c
View File

@ -115,14 +115,6 @@ void sl_trng_soft_reset( TRNG_TypeDef *device )
device->CONTROL = ctrl;
}
static inline
void sl_trng_write_test_data( TRNG_TypeDef *device, uint32_t data )
{
/* Wait for TESTDATA register to become ready for next word. */
while (device->STATUS & TRNG_STATUS_TESTDATABUSY);
device->TESTDATA = data;
}
static void sl_trng_clear_fifo( TRNG_TypeDef *device )
{
volatile uint32_t val32;
@ -150,54 +142,6 @@ int sl_trng_set_key( TRNG_TypeDef *device, const unsigned char *key )
return 0;
}
int sl_trng_check_conditioning( TRNG_TypeDef *device )
{
uint32_t val32;
int i, ret=0;
uint32_t ctrl = device->CONTROL;
/* Setup control register */
device->CONTROL = TRNG_CONTROL_ENABLE | TRNG_CONTROL_TESTEN |
TRNG_CONTROL_BYPNIST | TRNG_CONTROL_BYPAIS31;
/* Apply software reset */
sl_trng_soft_reset(device);
/* Write test vector to the key register. */
sl_trng_set_key(device,
(const unsigned char*)test_vector_conditioning_key);
/* Write test vector to the TESTDATA register */
for (i=0; i<TEST_VECTOR_CONDITIONING_INPUT_SIZE; i++)
{
sl_trng_write_test_data(device,
test_vector_conditioning_input[i]);
}
for (i=0; i<TEST_VECTOR_CONDITIONING_OUTPUT_SIZE; i++)
{
/* Wait for data to become available in the FIFO. */
while ( 0 == device->FIFOLEVEL );
/* Read output from the conditioning function */
val32 = device->FIFO;
/* Compare with expected test vector. */
if (val32 != test_vector_conditioning_output[i])
{
/*
mbedtls_printf("Conditioning test failed. "
"Test output word %d 0x%lx. Expected 0x%lx\n",
i, val32, test_vector_conditioning_output[i]);
*/
ret = SL_TRNG_ERR_CONDITIONING_TEST_FAILED;
}
}
/* Restore initial value of control register */
device->CONTROL = ctrl;
return ret;
}
static int sl_trng_check_status( TRNG_TypeDef *device )
{
uint32_t status = device->STATUS;
@ -246,57 +190,6 @@ static int sl_trng_check_status( TRNG_TypeDef *device )
return 0;
}
int sl_trng_check_entropy( TRNG_TypeDef *device )
{
volatile uint32_t val32;
int i, ret = 0;
uint32_t ctrl = device->CONTROL;
/* Setup control register */
device->CONTROL =
TRNG_CONTROL_ENABLE |
TRNG_CONTROL_REPCOUNTIEN |
TRNG_CONTROL_APT64IEN |
TRNG_CONTROL_APT4096IEN |
TRNG_CONTROL_PREIEN |
TRNG_CONTROL_ALMIEN;
/* Apply software reset */
sl_trng_soft_reset(device);
/* Check FIFO level is non-zero . */
for (i=0; i<FIFO_LEVEL_RETRY; i++)
{
if ( device->FIFOLEVEL )
{
break;
}
}
/* Check for no data within timeout (max retry count) */
if (i>=FIFO_LEVEL_RETRY)
{
ret = SL_TRNG_ERR_NO_DATA;
}
else
{
/* Read at least 4097x2 bits (~257 x 32 bits) in order for the longest
test to complete (adaptive proportion test of 4096 samples). */
for (i=0; i<TEST_WORDS_MIN; i++)
{
val32 = device->FIFO;
(void)val32;
}
/* Check in status register for errors. */
ret = sl_trng_check_status( device );
}
/* Restore initial value of control register */
device->CONTROL = ctrl;
return ret;
}
static void sl_trng_read_chunk( TRNG_TypeDef *device,
unsigned char *output,
size_t len )

21
targets/TARGET_Silicon_Labs/TARGET_EFM32/trng/sl_trng.h
View File

@ -152,27 +152,6 @@ void sl_trng_free( TRNG_TypeDef *ctx );
*/
int sl_trng_set_key( TRNG_TypeDef *ctx, const unsigned char *key );
/**
* \brief Check the TRNG conditioning function
*
* \param ctx TRNG device
*
* \return
* 0 if success. \ref SL_TRNG_ERR_CONDITIONING_TEST_FAILED on failure.
*/
int sl_trng_check_conditioning( TRNG_TypeDef *ctx );
/**
* \brief Check the TRNG entropy source is producing random data
*
* \param ctx TRNG device
*
* \return
* 0 if success. Error code if failure. Note that this function can return
* a \ref SL_TRNG_ERR_PRELIMINARY_NOISE_ALARM on some occasions.
*/
int sl_trng_check_entropy( TRNG_TypeDef *ctx );
/**
* \brief Poll for entropy data
*