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Merge pull request #11012 from c1728p9/remove_analog_out 

Remove FPGA analog out test
pull/11024/head
Martin Kojtal 2019-07-11 06:32:18 +01:00 committed by GitHub
parent 279f4cd584 8fffb94be2
commit 90aaa83723
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1 changed files with 0 additions and 133 deletions
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TESTS/mbed_hal_fpga_ci_test_shield/analogout/main.cpp
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/*
* Copyright (c) 2019, Arm Limited and affiliates.
* SPDX-License-Identifier: Apache-2.0
*
* Licensed under the Apache License, Version 2.0 (the "License");
* you may not use this file except in compliance with the License.
* You may obtain a copy of the License at
*
* http://www.apache.org/licenses/LICENSE-2.0
*
* Unless required by applicable law or agreed to in writing, software
* distributed under the License is distributed on an "AS IS" BASIS,
* WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
* See the License for the specific language governing permissions and
* limitations under the License.
*/
#if !DEVICE_ANALOGOUT
#error [NOT_SUPPORTED] Analog out not supported for this target
#elif !COMPONENT_FPGA_CI_TEST_SHIELD
#error [NOT_SUPPORTED] FPGA CI Test Shield is needed to run this test
#elif !defined(TARGET_FF_ARDUINO) && !defined(MBED_CONF_TARGET_DEFAULT_FORM_FACTOR)
#error [NOT_SUPPORTED] Test not supported for this form factor
#else
#include "utest/utest.h"
#include "unity/unity.h"
#include "greentea-client/test_env.h"
#include <inttypes.h>
#include "mbed.h"
using namespace utest::v1;
#include "MbedTester.h"
#include "pinmap.h"
#include "test_utils.h"
#if !DEVICE_ANALOGOUT
#error [NOT_SUPPORTED] Analog out not supported for this target
#endif
#define analogout_debug_printf(...)
#define DELTA_FLOAT 0.03f // 3%
/* Enable for power analysis */
#define DEBUG 0
const PinList *form_factor = pinmap_ff_default_pins();
const PinList *restricted = pinmap_restricted_pins();
MbedTester tester(form_factor, restricted);
void analogout_init_free(PinName pin)
{
dac_t analogout;
analogout_debug_printf("Analog output init/free test on pin=%s (%i)\r\n", pinmap_ff_default_pin_to_string(pin), pin);
analogout_init(&analogout, pin);
analogout_free(&analogout);
}
void analogout_test(PinName pin)
{
analogout_debug_printf("Analog input test on pin %s (%i)\r\n", pinmap_ff_default_pin_to_string(pin), pin);
tester.reset();
tester.peripherals_reset();
/* Test analog input */
dac_t analogout;
analogout_init(&analogout, pin);
tester.set_sample_adc(true);//begin ADC sampling on the FPGA
float anin;
float i;
for (i = 0.0f; i < 0.304f; i += 0.0303f) {//0V-1V, float
analogout_write(&analogout, i);
anin = tester.get_analog_in();
TEST_ASSERT_FLOAT_WITHIN(DELTA_FLOAT, (i * 3.3f), anin);
}
i = 0.0f;
for (uint16_t i_d16 = 0; i_d16 < 19851; i_d16 += 1985) {//0V-1V, 16-bit
analogout_write_u16(&analogout, i_d16);
anin = tester.get_analog_in();
TEST_ASSERT_FLOAT_WITHIN(DELTA_FLOAT, (i * 3.3f), anin);
i += 0.0303f;
}
analogout_free(&analogout);
tester.set_sample_adc(false);//stop ADC sampling on the FPGA
#if DEBUG
// power analysis
uint64_t sum;
uint32_t samples;
uint64_t cycles;
tester.get_anin_sum_samples_cycles(0, &sum, &samples, &cycles);
printf("ANIN0\r\n");
printf("Sum: %llu\r\n", sum);
printf("Num power samples: %d\r\n", samples);
printf("Num power cycles: %llu\r\n", cycles);
printf("ANIN0 voltage: %.6fV\r\n", tester.get_anin_voltage(0));
#endif
}
Case cases[] = {
// This will be run for all pins
Case("Analogout - init test", all_ports<AnalogoutPort, DefaultFormFactor, analogout_init_free>),
// This will be run for single pin
Case("Analogout - write/read test", all_ports<AnalogoutPort, DefaultFormFactor, analogout_test>),
};
utest::v1::status_t greentea_test_setup(const size_t number_of_cases)
{
GREENTEA_SETUP(120, "default_auto");
return greentea_test_setup_handler(number_of_cases);
}
Specification specification(greentea_test_setup, cases, greentea_test_teardown_handler);
int main()
{
Harness::run(specification);
}
#endif /* !DEVICE_ANALOGOUT */