mirror of https://github.com/ARMmbed/mbed-os.git
Updated MBED_A19 24LC256 EEPROM test. Added new test MBED_A25 24LC256 I2C EEPROM pattern write/read to test suite
Przemek Wirkus
parent
0f3d1cc59a
commit
77c96631cc
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@ -1,108 +1,126 @@
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#include "test_env.h"
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/******************************************************************************
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This will test an I2C EEPROM connected to mbed by writing a predefined byte at
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address 0 and then reading it back and comparing it with the known byte value a
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number of times. This test was written specifically for reproducing the bug
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reported here:
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https://mbed.org/forum/bugs-suggestions/topic/4128/
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Test configuration:
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* This will test an I2C EEPROM connected to mbed by writing a predefined byte at
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* address 0 and then reading it back and comparing it with the known byte value a
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* number of times. This test was written specifically for reproducing the bug
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* reported here:
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*
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* https://mbed.org/forum/bugs-suggestions/topic/4128/
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*
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* Test configuration:
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*
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* set 'ntests' to the number of iterations
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* set 'i2c_speed_hz' to the desired speed of the I2C interface
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* set 'i2c_delay_us' to the delay that will be inserted between 'write' and
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'read' I2C operations (https://mbed.org/users/mbed_official/code/mbed/issues/1
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for more details). '0' disables the delay.
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* 'read' I2C operations (https://mbed.org/users/mbed_official/code/mbed/issues/1
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* for more details). '0' disables the delay.
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* define I2C_EEPROM_VERBOSE to get verbose output
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The test ran with a 24LC256 external EEPROM memory, but any I2C EEPROM memory
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that uses two byte addresses should work.
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*
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* The test ran with a 24LC256 external EEPROM memory, but any I2C EEPROM memory
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* that uses two byte addresses should work.
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******************************************************************************/
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// Test configuration block
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static const int ntests = 10000;
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static const int i2c_freq_hz = 400000;
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static const int i2c_delay_us = 0;
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#define I2C_EEPROM_VERBOSE
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namespace {
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const int ntests = 10000;
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const int i2c_freq_hz = 400000;
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const int i2c_delay_us = 0;
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const int EEPROM_24LC256_SIZE = (256 * 1024 / 8); // 256 kbit memory
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}
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// End of test configuration block
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#if defined(TARGET_KL25Z)
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I2C i2c(PTE0, PTE1);
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I2C i2c(PTC9, PTC8);
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#elif defined(TARGET_KL46Z)
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I2C i2c(PTC9, PTC8);
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#elif defined(TARGET_LPC812)
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I2C i2c(P0_10, P0_11);
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#elif defined(TARGET_LPC1549)
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I2C i2c(P0_23, P0_22);
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#elif defined(TARGET_NUCLEO_F103RB)
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I2C i2c(I2C_SDA, I2C_SCL);
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#elif defined(TARGET_K64F)
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I2C i2c(PTE25, PTE24);
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#else
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I2C i2c(p28, p27);
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#endif
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#ifdef I2C_EEPROM_VERBOSE
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#define dprintf printf
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#else
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int dprintf(const char* args, ...) {
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return 0;
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}
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#endif
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int main() {
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const int addr = 0xA0;
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const char mark = 0x66;
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char data[3];
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int fw = 0, fr = 0, fc = 0;
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int i2c_stat;
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i2c.frequency(i2c_freq_hz);
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// Data write
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data[0] = data[1] = 0;
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data[2] = mark;
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if((i2c_stat = i2c.write(addr, data, 3)) != 0) {
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dprintf("Unable to write data to EEPROM (i2c_stat = 0x%02X), aborting\r\n", i2c_stat);
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notify_completion(false);
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return 1;
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}
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// ACK polling (assumes write will be successful eventually)
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while(i2c.write(addr, data, 0) != 0);
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// Data read (actual test)
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for(int i = 0; i < ntests; i ++)
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{
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data[0] = data[1] = 0;
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if((i2c_stat = i2c.write(addr, data, 2, true)) != 0)
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{
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dprintf("Test %d failed at write, i2c_stat is 0x%02X\r\n", i, i2c_stat);
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fw ++;
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continue;
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}
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if(i2c_delay_us != 0)
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wait_us(i2c_delay_us);
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if((i2c_stat = i2c.read(addr, data, 1)) != 0)
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{
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dprintf("Test %d failed at read, i2c_stat is 0x%02X\r\n", i, i2c_stat);
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fr ++;
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continue;
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}
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if(data[0] != mark)
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{
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dprintf("Test %d failed at data match\r\n", i);
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fc ++;
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}
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}
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dprintf("Test finished.\r\n");
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if(fw + fr + fc == 0)
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dprintf("No failures in %d tests.\r\n", ntests);
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else
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{
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dprintf("Statistics:\r\n");
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dprintf(" Total tests: %d\r\n", ntests);
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dprintf(" Failed at write: %d\r\n", fw);
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dprintf(" Failed at read: %d\r\n", fr);
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dprintf(" Data mismatch: %d\r\n", fc);
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dprintf(" Total failures: %d\r\n", fw + fr + fc);
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notify_completion(false);
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}
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notify_completion(true);
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int main()
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{
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const int EEPROM_MEM_ADDR = 0xA0;
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const char MARK = 0x66;
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int fw = 0;
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int fr = 0;
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int fc = 0;
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int i2c_stat = 0;
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bool result = true;
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i2c.frequency(i2c_freq_hz);
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// Data write
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{
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char data[] = { 0, 0, MARK };
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if ((i2c_stat = i2c.write(EEPROM_MEM_ADDR, data, sizeof(data))) != 0) {
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printf("Unable to write data to EEPROM (i2c_stat = 0x%02X), aborting\r\n", i2c_stat);
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notify_completion(false);
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return 1;
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}
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// ACK polling (assumes write will be successful eventually)
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while (i2c.write(EEPROM_MEM_ADDR, data, 0) != 0)
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;
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}
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// Data read (actual test)
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for (int i = 0; i < ntests; i++) {
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// Write data to EEPROM memory
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{
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char data[] = { 0, 0 };
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if ((i2c_stat = i2c.write(EEPROM_MEM_ADDR, data, 2, true)) != 0) {
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printf("Test %d failed at write, i2c_stat is 0x%02X\r\n", i, i2c_stat);
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fw++;
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continue;
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}
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}
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// us delay if specified
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if (i2c_delay_us != 0)
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wait_us(i2c_delay_us);
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// Read data
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{
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char data[1] = { 0 };
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if ((i2c_stat = i2c.read(EEPROM_MEM_ADDR, data, 1)) != 0) {
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printf("Test %d failed at read, i2c_stat is 0x%02X\r\n", i, i2c_stat);
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fr++;
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continue;
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}
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if (data[0] != MARK) {
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printf("Test %d failed at data match\r\n", i);
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fc++;
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}
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}
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}
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result = (fw + fr + fc == 0);
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printf("EEPROM: Test result ... [%s]\r\n", result ? "OK" : "FAIL");
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if (!result) {
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printf("Test Statistics:\r\n");
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printf("\tTotal tests: %d\r\n", ntests);
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printf("\tFailed at write: %d\r\n", fw);
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printf("\tFailed at read: %d\r\n", fr);
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printf("\tData mismatch: %d\r\n", fc);
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printf("\tTotal failures: %d\r\n", fw + fr + fc);
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}
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notify_completion(result);
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}
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@ -0,0 +1,114 @@
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#include "test_env.h"
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/******************************************************************************
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* This will test an I2C EEPROM connected to mbed by writing a predefined byte at
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* address 0 and then reading it back and comparing it with the known byte value a
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* number of times. This test was written specifically for reproducing the bug
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* reported here:
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*
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* https://mbed.org/forum/bugs-suggestions/topic/4128/
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*
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* Test configuration:
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*
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* set 'ntests' to the number of iterations
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* set 'i2c_speed_hz' to the desired speed of the I2C interface
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* set 'i2c_delay_us' to the delay that will be inserted between 'write' and
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* 'read' I2C operations (https://mbed.org/users/mbed_official/code/mbed/issues/1
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* for more details). '0' disables the delay.
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* define I2C_EEPROM_VERBOSE to get verbose output
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*
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* The test ran with a 24LC256 external EEPROM memory, but any I2C EEPROM memory
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* that uses two byte addresses should work.
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******************************************************************************/
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// Test configuration block
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namespace {
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const int ntests = 1000;
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const int i2c_freq_hz = 400000;
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const int i2c_delay_us = 0;
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// const int EEPROM_24LC256_SIZE = (256 * 1024 / 8); // 256 kbit memory
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}
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// End of test configuration block
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#if defined(TARGET_KL25Z)
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I2C i2c(PTC9, PTC8);
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#elif defined(TARGET_KL46Z)
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I2C i2c(PTC9, PTC8);
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#elif defined(TARGET_LPC812)
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I2C i2c(P0_10, P0_11);
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#elif defined(TARGET_LPC1549)
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I2C i2c(P0_23, P0_22);
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#elif defined(TARGET_NUCLEO_F103RB)
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I2C i2c(I2C_SDA, I2C_SCL);
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#elif defined(TARGET_K64F)
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I2C i2c(PTE25, PTE24);
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#else
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I2C i2c(p28, p27);
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#endif
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#define PATTERN_MASK 0x66, ~0x66, 0x00, 0xFF, 0xA5, 0x5A, 0xF0, 0x0F
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int main()
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{
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const int EEPROM_MEM_ADDR = 0xA0;
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int i2c_stat = 0;
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bool result = true;
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i2c.frequency(i2c_freq_hz);
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printf("I2C: Lines pattern write test ... ");
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int write_errors = 0;
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for (int i = 0; i < ntests; i++) {
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char data[] = { 0 /*MSB*/, 0 /*LSB*/, PATTERN_MASK };
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const int addr = i * 8; // 8 bytes of data in data array
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data[0] = ((0xFF00 & addr) >> 8) & 0x00FF;
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data[1] = (addr & 0x00FF);
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if ((i2c_stat = i2c.write(EEPROM_MEM_ADDR, data, sizeof(data))) != 0)
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write_errors++;
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while (i2c.write(EEPROM_MEM_ADDR, NULL, 0)) ; // wait to complete
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// us delay if specified
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if (i2c_delay_us != 0)
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wait_us(i2c_delay_us);
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}
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printf("[%s]\r\n", write_errors ? "FAIL" : "OK");
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printf("I2C: Write errors: %d ... [%s]\r\n", write_errors, write_errors ? "FAIL" : "OK");
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printf("I2C: Lines pattern read test ... ");
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int read_errors = 0;
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int pattern_errors = 0;
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for (int i = 0; i < ntests; i++) {
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char data[8] = { 0 }; // General puspose buffer
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const int addr = i * 8; // 8 bytes of data in data array
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data[0] = ((0xFF00 & addr) >> 8) & 0x00FF;
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data[1] = (addr & 0x00FF);
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// Set address for read
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if ((i2c_stat = i2c.write(EEPROM_MEM_ADDR, data, 2, true)) != 0) {
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}
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if ((i2c_stat = i2c.read(EEPROM_MEM_ADDR, data, 8)) != 0)
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read_errors++;
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static char pattern[] = { PATTERN_MASK };
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if (memcmp(pattern, data, sizeof(data)))
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pattern_errors++;
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}
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printf("[%s]\r\n", read_errors ? "FAIL" : "OK");
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printf("I2C: Read errors: %d ... [%s]\r\n", read_errors, read_errors ? "FAIL" : "OK");
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printf("EEPROM: Pattern match errors: %d ... [%s]\r\n", pattern_errors, pattern_errors ? "FAIL" : "OK");
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result = write_errors == 0 && read_errors == 0;
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notify_completion(result);
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}
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@ -92,7 +92,7 @@ TESTS = [
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"id": "MBED_A3", "description": "C++ STL",
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"source_dir": join(TEST_DIR, "mbed", "stl"),
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"dependencies": [MBED_LIBRARIES, TEST_MBED_LIB],
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"automated": True,
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"automated": False,
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},
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{
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"id": "MBED_A4", "description": "I2C TMP102",
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@ -158,6 +158,7 @@ TESTS = [
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"source_dir": join(TEST_DIR, "mbed", "sd"),
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"dependencies": [MBED_LIBRARIES, TEST_MBED_LIB, SD_FS, FAT_FS],
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"automated": True,
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"duration": 15,
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"peripherals": ["SD"]
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},
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{
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@ -236,6 +237,13 @@ TESTS = [
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"mcu": ["LPC1768"],
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"peripherals": ["extra_serial"]
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},
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{
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"id": "MBED_A25", "description": "I2C EEPROM line read/write test",
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"source_dir": join(TEST_DIR, "mbed", "i2c_eeprom_line"),
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"dependencies": [MBED_LIBRARIES, TEST_MBED_LIB],
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"peripherals": ["24LC256"],
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"automated": True,
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},
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# Size benchmarks
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{
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@ -353,6 +361,7 @@ TESTS = [
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"id": "MBED_15", "description": "RPC",
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"source_dir": join(TEST_DIR, "mbed", "rpc"),
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"dependencies": [MBED_LIBRARIES, join(LIB_DIR, "rpc"), TEST_MBED_LIB],
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"mcu": ["LPC1768"],
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"automated": True,
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},
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{
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