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SFDP: unit tests: Fix Configuration ID in fake test data 

The second byte of the sector map descriptor is the configuration ID.
On a device with non-configurable layout, the only available map
descriptor's configuration ID must be 0x00 as required by the
JESD216D standard. This value is important, because we will check
each descriptor's configuration ID when we support multiple
configurations.

Note: The test data is fake - when we modified real data of a
configurable device to become non-configurable for test purpose, we
forgot to change this field.
pull/14989/head
Lingkai Dong 2021-08-09 13:02:03 +01:00
parent 50183d2ee4
commit 0cb62c4944
1 changed files with 2 additions and 2 deletions
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4
storage/blockdevice/tests/UNITTESTS/SFDP/test_sfdp.cpp
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@ -33,7 +33,7 @@ static const mbed::bd_addr_t sector_map_start_addr = 0xD81000;
* three regions for test purpose.
*/
static const uint8_t sector_map_single_descriptor[] {
0xFF, 0x01, 0x02, 0xFF, // header, highest region = 0x02
0xFF, 0x00, 0x02, 0xFF, // header, highest region = 0x02
0xF1, 0x7F, 0x00, 0x00, // region 0
0xF4, 0x7F, 0x03, 0x00, // region 1
0xF4, 0xFF, 0xFB, 0x03 // region 2
@ -255,7 +255,7 @@ TEST_F(TestSFDP, TestMoreRegionsThanSupported)
* twelve regions for test purpose.
*/
const uint8_t sector_map_single_descriptor_twelve_regions[] {
0xFF, 0x01, 0x0B, 0xFF, // header, highest region = 0x0B
0xFF, 0x00, 0x0B, 0xFF, // header, highest region = 0x0B
0xF1, 0x7F, 0x00, 0x00, // region 0
0xF4, 0x7F, 0x03, 0x00, // region 1
0xF4, 0xFF, 0xFB, 0x03, // region 2